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Daniel P. Cram — 50 Patents

Micron: 49 patents #373 of 6,374Top 6%

Boise, ID: #213 of 3,546 inventorsTop 7%

Idaho: #282 of 8,810 inventorsTop 4%

Overall (All Time): #53,743 of 4,157,543Top 2%

50 Patents All Time

Daniel P. Cram has been granted 50 US patents while listed as an inventor at Micron. The first was granted in 2000 and the most recent in December 2025. Daniel P. Cram ranks #53,743 of 4,157,543 US inventors in our database (top 1.3%). Patent records list Daniel P. Cram in Boise, ID, US.

Patents per Year

Issued Patents All Time

Showing 1–25 of 50 patents

Patent #	Title	Co-Inventors	Date	Approx Value ⓘ
12499957	Thermal conduction based batch testing system	—	2025-12-16
8749261	Interfaces having a plurality of connector assemblies	Scott Hoagland	2014-06-10	$11,699,000
8624615	Isolation circuit	Hani S. Attalla	2014-01-07	$10,883,000
8074353	Methods of providing semiconductor components within sockets	A. Jay Stutzman	2011-12-13	$2,397,000
8063646	Apparatus and methods for testing microelectronic devices	A. Jay Stutzman	2011-11-22	$2,392,000
8011092	Methods of providing semiconductor components within sockets	A. Jay Stutzman	2011-09-06	$2,341,000
8004297	Isolation circuit	Hani S. Attalla	2011-08-23	$1,801,000
7918383	Methods for placing substrates in contact with molten solder	Kyle K. Kirby, Salman Akram, Roy Lange, Warren M. Farnworth	2011-04-05	$7,033,000
7857646	Electrical testing apparatus having masked sockets and associated systems and methods	A. Jay Stutzman	2010-12-28	$2,833,000
7692437	Systems and methods for testing packaged microelectronic devices	A. Jay Stutzman	2010-04-06	$3,801,000
7586319	Methods of retaining semiconductor component configurations within sockets	A. Jay Stutzman	2009-09-08	$7,238,000
7570069	Resilient contact probes	Scott Hoagland	2009-08-04	$6,100,000
7541825	Isolation circuit	Hani S. Attalla	2009-06-02	$4,872,000
7514945	Systems configured for utilizing semiconductor components	A. Jay Stutzman	2009-04-07	$3,025,000
7456504	Electronic component assemblies with electrically conductive bonds	Steven L. Hamren	2008-11-25	$1,143,000
7439752	Methods of providing semiconductor components within sockets	A. Jay Stutzman	2008-10-21	$1,313,000
7427869	Resilient contact probe apparatus	Scott Hoagland	2008-09-23	$1,890,000
7425839	Systems and methods for testing packaged microelectronic devices	A. Jay Stutzman	2008-09-16	$2,780,000
7279915	Test method for electronic modules using movable test contactors	—	2007-10-09	$1,129,000
7274197	Contact system for interfacing a semiconductor wafer to an electrical tester	—	2007-09-25	$1,063,000
7265563	Test method for semiconductor components using anisotropic conductive polymer contact system	—	2007-09-04	$3,143,000
7176702	Contact system for wafer level testing	—	2007-02-13	$2,321,000
7135345	Methods for processing semiconductor devices in a singulated form	Steven L. Hamren	2006-11-14	$3,511,000
7129721	Method and apparatus for processing semiconductor devices in a singulated form	Steven L. Hamren	2006-10-31
7126228	Apparatus for processing semiconductor devices in a singulated form	Steven L. Hamren	2006-10-24	$2,972,000