SH

Steven L. Hamren

Micron: 21 patents #832 of 6,345Top 15%
Overall (All Time): #186,316 of 4,157,543Top 5%
23
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7456504 Electronic component assemblies with electrically conductive bonds Daniel P. Cram 2008-11-25
7135345 Methods for processing semiconductor devices in a singulated form Daniel P. Cram 2006-11-14
7129721 Method and apparatus for processing semiconductor devices in a singulated form Daniel P. Cram 2006-10-31
7126228 Apparatus for processing semiconductor devices in a singulated form Daniel P. Cram 2006-10-24
7122389 Method for processing semiconductor devices in a singulated form Daniel P. Cram 2006-10-17
6579399 Method and system for handling semiconductor components 2003-06-17
6543512 Carrier, method and system for handling semiconductor components 2003-04-08
6504390 Conductive bump array contactors having an ejector and methods of testing using same 2003-01-07
6504391 Conductive bump array contactors having an ejector and methods of testing using same 2003-01-07
6492826 Conductive bump array contactors having an ejector and methods of testing using same 2002-12-10
6490188 Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devices James P. Nuxoll 2002-12-03
6483332 Conductive bump array contactors having an ejector and methods of testing using same 2002-11-19
6459288 Conductive bump array contactors having an ejector and methods of testing using same 2002-10-01
6459289 Conductive bump array contactors having an ejector and methods of testing using same 2002-10-01
6442056 Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devices James P. Nuxoll 2002-08-27
6388459 Conductive bump array contactors having an ejector and methods of testing using same 2002-05-14
6362639 Compliant contactor for testing semiconductors Justin L. Lawrence 2002-03-26
6307769 Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devices James P. Nuxoll 2001-10-23
6293817 Extended length, high frequency contactor block Justin L. Lawrence 2001-09-25
6265886 Conductive bump array contactors having an ejector and methods of testing using same 2001-07-24
6259263 Compliant contactor for testing semiconductors Justin L. Lawrence 2001-07-10
5927503 Tray for processing and/or shipping integrated circuit device Leland R. Nevill, William C. Layer, Gregory A. Barnett 1999-07-27
5731230 Method for processing and/or shipping integrated circuit devices Leland R. Nevill, William C. Layer, Gregory A. Barnett 1998-03-24