NC

Natale M. Ceglio

MS Media Lario S.R.L.: 12 patents #1 of 40Top 3%
UE US Dept of Energy: 6 patents #64 of 5,099Top 2%
University of California: 2 patents #4,561 of 18,278Top 25%
US Ultratech Stepper: 1 patents #22 of 40Top 60%
KL Kla-Tencor: 1 patents #316 of 626Top 55%
📍 Pleasanton, CA: #326 of 3,062 inventorsTop 15%
🗺 California: #27,156 of 386,348 inventorsTop 8%
Overall (All Time): #209,191 of 4,157,543Top 6%
21
Patents All Time

Issued Patents All Time

Showing 1–21 of 21 patents

Patent #TitleCo-InventorsDate
9609731 Systems and methods for synchronous operation of debris-mitigation devices Raymond Merrill, Jr., Daniel Stearns 2017-03-28
9585236 Sn vapor EUV LLP source system for EUV lithography Daniel Stearns, Richard Levesque 2017-02-28
9057962 Source-collector module with GIC mirror and LPP EUV light source Giovanni Nocerino, Fabio Zocchi 2015-06-16
8895946 Source-collector modules for EUV lithography employing a GIC mirror and a LPP source Daniel Stearns, Jacques Kools, Giuseppe Valsecchi, Fabio Zocchi, Riccardo Binda 2014-11-25
8873025 EUV collector system with enhanced EUV radiation collection Gopal Vasudevan 2014-10-28
8746975 Thermal management systems, assemblies and methods for grazing incidence collectors for EUV lithography Giovanni Bianucci, Fabio Zocchi, Robert Banham, Marco Pedrali, Boris Grek +5 more 2014-06-10
8731139 Evaporative thermal management of grazing incidence collectors for EUV lithography Boris Grek, Daniel Stearns 2014-05-20
8686381 Source-collector module with GIC mirror and tin vapor LPP target system Richard Levesque, Giovanni Nocerino, Fabio Zocchi 2014-04-01
8587768 EUV collector system with enhanced EUV radiation collection Gopal Vasudevan 2013-11-19
8344339 Source-collector module with GIC mirror and tin rod EUV LPP target system Richard Levesque, Giovanni Nocerino, Fabio Zocchi 2013-01-01
8330131 Source-collector module with GIC mirror and LPP EUV light source Giovanni Nocerino, Fabio Zocchi 2012-12-11
8258485 Source-collector module with GIC mirror and xenon liquid EUV LPP target system Richard Levesque, Giovanni Nocerino, Fabio Zocchi 2012-09-04
6770862 Scalable wafer inspection Dragos Maciuca 2004-08-03
6010600 Maskless deposition technique for the physical vapor deposition of thin film and multilayer coatings with subnanometer precision and accuracy Stephen P. Vernon 2000-01-04
6002553 Giant magnetoresistive sensor Daniel G. Stearns, Stephen P. Vernon, Andrew M. Hawryluk 1999-12-14
5691541 Maskless, reticle-free, lithography David A. Markle 1997-11-25
5257132 Broadband diffractive lens or imaging element Andrew M. Hawryluk, Richard London, Lynn G. Seppala 1993-10-26
5178974 Virtually distortion-free imaging system for large field, high resolution lithography using electrons, ions or other particle beams Andrew M. Hawryluk 1993-01-12
5176970 Virtually distortion-free imaging system for large field, high resolution lithography Andrew M. Hawryluk 1993-01-05
5071207 Broadband diffractive lens or imaging element Andrew M. Hawryluk, Richard London, Lynn G. Seppala 1991-12-10
4870648 X-ray beamsplitter Daniel Stearns, Andrew M. Hawryluk, Troy W. Barbee, Jr. 1989-09-26