Issued Patents All Time
Showing 251–266 of 266 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8537725 | Method and apparatus for rebalancing the sizes of the downlink (DL) association sets for component carriers having different time division duplex subframe configurations | Erlin Zeng, Jing Han, Wei Bai, Chunyan Gao, Na Wei | 2013-09-17 |
| 8520640 | Frequency quality criteria for inter-frequency handover in a TD-CDMA communication system | Yuan Zhu, Jianfeng Kang | 2013-08-27 |
| 8456639 | Measurement of critical dimension | Shankar Krishnan | 2013-06-04 |
| 8446584 | Reconfigurable spectroscopic ellipsometer | Shankar Krishnan | 2013-05-21 |
| 8190157 | Frequency quality criteria for inter-frequency handover in a TD-CDMA communication system | Yuan Zhu, Jiangeng Kang | 2012-05-29 |
| 8040511 | Azimuth angle measurement | Shankar Krishnan, Haixing Zhou, David Lidsky, Walter D. Mieher | 2011-10-18 |
| 8000272 | Uplink scheduling grant for time division duplex with asymmetric uplink and downlink configuration | Adele Gao, Yuan Zhu, Dajie JIANG | 2011-08-16 |
| 7483133 | Multiple angle of incidence spectroscopic scatterometer system | Noah Bareket | 2009-01-27 |
| 7463369 | Systems and methods for measuring one or more characteristics of patterned features on a specimen | Dan Wack, Kenneth P. Gross | 2008-12-09 |
| 7054006 | Self-calibrating beam profile ellipsometer | Jeffrey T. Fanton, Lanhua Wei | 2006-05-30 |
| 6804003 | System for analyzing surface characteristics with self-calibrating capability | Patrick M. Maxton, Kenneth C. Johnson, Mehrdad Nikoonahad | 2004-10-12 |
| 6734968 | System for analyzing surface characteristics with self-calibrating capability | Patrick M. Maxton, Kenneth C. Johnson, Mehrdad Nikoonahad | 2004-05-11 |
| 6611330 | System for measuring polarimetric spectrum and other properties of a sample | Shing Lee, Adam E. Norton, Mehrdad Nikoonahad | 2003-08-26 |
| 6552803 | Detection of film thickness through induced acoustic pulse-echos | Shing Lee, Mehrdad Nikoonahad | 2003-04-22 |
| 6184984 | System for measuring polarimetric spectrum and other properties of a sample | Shing Lee, Adam E. Norton, Mehrdad Nikoonahad | 2001-02-06 |
| 6108087 | Non-contact system for measuring film thickness | Mehrdad Nikoonahad, Shing Lee | 2000-08-22 |