CW

Christian Wolters

KL Kla-Tencor: 37 patents #38 of 1,394Top 3%
FU Florida State University: 1 patents #47 of 135Top 35%
KL Kla: 1 patents #347 of 758Top 50%
📍 San Jose, CA: #1,383 of 32,062 inventorsTop 5%
🗺 California: #11,329 of 386,348 inventorsTop 3%
Overall (All Time): #79,140 of 4,157,543Top 2%
40
Patents All Time

Issued Patents All Time

Showing 26–40 of 40 patents

Patent #TitleCo-InventorsDate
7746462 Inspection systems and methods for extending the detection range of an inspection system by forcing the photodetector into the non-linear range Zhongping Cai, Alexander Slobodov, Anatoly Romanovsky 2010-06-29
7697129 Systems and methods for inspecting a wafer with increased sensitivity Kurt L. Haller, David W. Shortt 2010-04-13
7671982 Systems, circuits and methods for reducing thermal damage and extending the detection range of an inspection system Anatoly Romanovsky 2010-03-02
7607647 Stabilizing a substrate using a vacuum preload air bearing chuck Guoheng Zhao, Alexander Belyaev, Paul Doyle, Howard Dando, Mehdi Vaez-Iravani 2009-10-27
7605915 System and method to create haze standard Aleksey Petrenko, Jurgen Reich 2009-10-20
7548308 Illumination energy management in surface inspection Wayne MCMILLAN 2009-06-16
7511816 Methods and systems for determining drift in a position of a light beam with respect to a chuck Juergen Reich, Yevgeny Kruptesky 2009-03-31
7436508 Systems, circuits and methods for reducing thermal damage and extending the detection range of an inspection system Anatoly Romanovsky 2008-10-14
7423250 Systems, circuits and methods for extending the detection range of an inspection system by avoiding circuit saturation Anatoly Romanovsky, Alexander Slobodov 2008-09-09
7414715 Systems, circuits and methods for extending the detection range of an inspection system by avoiding detector saturation Anatoly Romanovsky, Alexander Slobodov 2008-08-19
7372559 Systems and methods for inspecting a wafer with increased sensitivity Kurt L. Haller, David W. Shortt 2008-05-13
7304310 Methods and systems for inspecting a specimen using light scattered in different wavelength ranges David W. Shortt 2007-12-04
7027146 Methods for forming a calibration standard and calibration standards for inspection systems Ian Smith, Yu Guan, Don Brayton 2006-04-11
5858926 Process for preparing mercury-barium-calcium-copper-oxide-based superconductor materials Justin Schwartz, Kathleen Melanie Amm 1999-01-12
PP10308 Rosemary plant named `Silver Spires` Christine P. Wolters 1998-03-31