Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6765651 | Fast image simulation for photolithography | Peter Fiekowsky, Paul R. Kube | 2004-07-20 |
| 5578821 | Electron beam inspection system and method | Dan Meisberger, Alan D. Brodie, Anil Desai, Dennis G. Emge, Zhong-Wei Chen +7 more | 1996-11-26 |
| 5502306 | Electron beam inspection system and method | Dan Meisburger, Alan D. Brodie, Curt H. Chadwick, Anil Desai, Hans-Peter Dohse +28 more | 1996-03-26 |