| 8233735 |
Methods and apparatus for detection of fluorescently labeled materials |
David Stern |
2012-07-31 |
| 7472372 |
Fast image simulation for photolithography |
Richard Erich Schuster |
2008-12-30 |
| 6765651 |
Fast image simulation for photolithography |
Paul R. Kube, April Dutta |
2004-07-20 |
| 6760473 |
Optical proximity correction serif measurement technique |
— |
2004-07-06 |
| 6741344 |
Method and apparatus for detection of fluorescently labeled materials |
David Stern |
2004-05-25 |
| 6649914 |
Scanning-beam X-ray imaging system |
Jack W. Moorman, Brian Skillicorn, Edward G. Solomon, John W. Wilent, deceased, Abigail A. Moorhouse +1 more |
2003-11-18 |
| 6611767 |
Scanned image alignment systems and methods |
Dan Bartell |
2003-08-26 |
| 6539331 |
Microscopic feature dimension measurement system |
— |
2003-03-25 |
| 6405153 |
Microscopic feature opacity measurement system |
— |
2002-06-11 |
| 6397165 |
Microscopic corner radius measurement system |
— |
2002-05-28 |
| 6263292 |
High accuracy particle dimension measurement system |
— |
2001-07-17 |
| 6252236 |
Method and apparatus for imaging a sample on a device |
Mark Trulson, David Stern, Richard P. Rava, Ian Walton, Stephen P. A. Fodor |
2001-06-26 |
| 6167355 |
High accuracy particle dimension measurement system |
— |
2000-12-26 |
| 6141096 |
Method and apparatus for detection of fluorescently labeled materials |
David Stern |
2000-10-31 |
| 6090555 |
Scanned image alignment systems and methods |
Dan Bartell |
2000-07-18 |
| 6025601 |
Method and apparatus for imaging a sample on a device |
Mark Trulson, David Stern, Richard P. Rava, Ian Walton, Stephen P. A. Fodor |
2000-02-15 |
| 5966677 |
High accuracy particle dimension measurement system |
— |
1999-10-12 |
| 5834758 |
Method and apparatus for imaging a sample on a device |
Mark Trulson, David Stern, Richard P. Rava, Ian Walton, Stephen P. A. Fodor |
1998-11-10 |
| 5835561 |
Scanning beam x-ray imaging system |
Jack W. Moorman, Brian Skillicorn, Edward G. Solomon, John W. Wilent, deceased, Abigail A. Moorhouse +1 more |
1998-11-10 |
| 5764209 |
Flat panel display inspection system |
Jeffrey Hawthorne, Daniel H. Scott, Robert E. Cummins |
1998-06-09 |
| 5751785 |
Image reconstruction methods |
Jack W. Moorman, Brian Skillicorn, Edward G. Solomon, John W. Wilent, deceased, Abigail A. Moorhouse +1 more |
1998-05-12 |
| 5729584 |
Scanning-beam X-ray imaging system |
Jack W. Moorman, Brian Skillicorn, Edward G. Solomon, John W. Wilent, deceased, Abigail A. Moorhouse +1 more |
1998-03-17 |
| 5644612 |
Image reconstruction methods |
Jack W. Moorman, Edward G. Solomon, John W. Wilent, deceased, Abigail A. Moorhouse, Robert E. Melen |
1997-07-01 |
| 5631734 |
Method and apparatus for detection of fluorescently labeled materials |
David Stern |
1997-05-20 |
| 5578832 |
Method and apparatus for imaging a sample on a device |
Mark Trulson, David Stern, Richard P. Rava, Ian Walton, Stephen P. A. Fodor |
1996-11-26 |