Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11494922 | Object tracking device, object tracking method, and object tracking program | — | 2022-11-08 |
| 11341739 | Image processing device, image processing method, and program recording medium | — | 2022-05-24 |
| 10867394 | Object tracking device, object tracking method, and recording medium | — | 2020-12-15 |
| 9836665 | Management system, list production device, method, computer readable recording medium, data structure, and printed label | Yasuyoshi Matsumoto | 2017-12-05 |
| 9830336 | Information processing device, information processing method and information processing program | Shoji Yachida | 2017-11-28 |
| 9430711 | Feature point matching device, feature point matching method, and non-transitory computer readable medium storing feature matching program | — | 2016-08-30 |
| 8520981 | Document retrieval of feature point groups using a geometrical transformation | — | 2013-08-27 |
| 8199970 | Moving amount calculation system and obstacle detection system | — | 2012-06-12 |
| 7702413 | Semiconductor device manufacturing system and method for manufacturing semiconductor devices including calculating oxide film thickness using real time simulator | Yukihiro Ushiku, Akira Ogawa, Hidenori Kakinuma, Shunji Shuto, Masahiro Abe +1 more | 2010-04-20 |
| 7272460 | Method for designing a manufacturing process, method for providing manufacturing process design and technology computer-aided design system | Masahiro Abe, Kenji Hirakawa, Shigeru Komatsu | 2007-09-18 |
| 6775816 | Semiconductor design/fabrication system, semiconductor design/fabrication method and semiconductor design/fabrication program | Yoshiyuki Sato, Shigeki Sugimoto | 2004-08-10 |
| 6657735 | Method of evaluating critical locations on a semiconductor apparatus pattern | Tomonobu Noda | 2003-12-02 |
| 5643046 | Polishing method and apparatus for detecting a polishing end point of a semiconductor wafer | Ichiro Katakabe, Naoto Miyashita | 1997-07-01 |
| 5374835 | Field effect transistor using compound semiconductor | Kizashi Shimada, Mayumi Kamura | 1994-12-20 |
| 5260603 | Electrode structure of semiconductor device for use in GaAs compound substrate | Mayumi Kamura, Souichi Imamura | 1993-11-09 |
| 5229323 | Method for manufacturing a semiconductor device with Schottky electrodes | Kizashi Shimada, Yutaka Koshino | 1993-07-20 |
| 5049954 | GaAs field effect semiconductor device having Schottky gate structure | Kizashi Shimada, Yutaka Koshino | 1991-09-17 |
| 5031021 | Semiconductor device with a high breakdown voltage | Yoshiro Baba, Kazuo Tsuru, Yutaka Koshino | 1991-07-09 |
| 4729966 | Process for manufacturing a Schottky FET device using metal sidewalls as gates | Yutaka Koshino, Shunichi Hiraki | 1988-03-08 |
| 4710794 | Composite semiconductor device | Yutaka Koshino, Yoshiro Baba | 1987-12-01 |
| 4700455 | Method of fabricating Schottky gate-type GaAs field effect transistor | Kizashi Shimada, Yutaka Koshino | 1987-10-20 |
| 4532004 | Method of manufacturing a semiconductor device | Yutaka Koshino, Shunichi Hiraki | 1985-07-30 |
| 4352726 | Ion selective field-effect sensor | Takuo Sugano, Eiji Niki, Yoichi Okabe | 1982-10-05 |