Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9279762 | Apparatus and method for measuring semiconductor carrier lifetime | Kazushi Hayashi, Hiroyuki Takamatsu, Yoshito Fukumoto | 2016-03-08 |
| 5943437 | Method and apparatus for classifying a defect on a semiconductor wafer | Tsutomu Morimoto, Yuichiro Gotoh, Eiji Takahashi, Shouji Kanbe, Akira Okamoto | 1999-08-24 |
| 5790252 | Method of and apparatus for determining residual damage to wafer edges | Hisashi Masumura, Hideo Kudo, Hidetoshi Tsunaki, Yuji Hirao, Noritaka Morioka | 1998-08-04 |
| 5760597 | Method of and apparatus for measuring lifetime of carriers in semiconductor sample | Naoyuki Yoshida, Hiroyuki Takamatsu, Yutaka Kawata, Hidehisa Hashizume, Futoshi Ojima +1 more | 1998-06-02 |
| 5619326 | Method of sample valuation based on the measurement of photothermal displacement | Hiroyuki Takamatsu, Tsutomu Morimoto, Naoyuki Yoshida | 1997-04-08 |
| 5298970 | Sample evaluating method by using thermal expansion displacement | Hiroyuki Takamatsu, Yoshiro Nishimoto | 1994-03-29 |