Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5943437 | Method and apparatus for classifying a defect on a semiconductor wafer | Shingo Sumie, Tsutomu Morimoto, Eiji Takahashi, Shouji Kanbe, Akira Okamoto | 1999-08-24 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5943437 | Method and apparatus for classifying a defect on a semiconductor wafer | Shingo Sumie, Tsutomu Morimoto, Eiji Takahashi, Shouji Kanbe, Akira Okamoto | 1999-08-24 |