TM

Tsutomu Morimoto

KS Kobe Steel: 4 patents #359 of 1,773Top 25%
TI Toray Industries: 4 patents #687 of 3,690Top 20%
KS Kobe Steel: 3 patents #504 of 2,031Top 25%
UT University Of Tokushima: 1 patents #12 of 80Top 15%
IBM: 1 patents #44,794 of 70,183Top 65%
TI Texas Instruments: 1 patents #7,357 of 12,488Top 60%
Overall (All Time): #382,665 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
9330834 Reactor Kenichi Inoue, Koji Inoue, Hiroshi Hashimoto 2016-05-03
8476582 Device for measuring radiation intensity of small sealed radioactive source for cancer therapy Takuya Saze, Shintaro Nakayama, Shunsuke Furutani, Yoshinori Kuwahara, Yusuke Kinoshita +3 more 2013-07-02
7800702 Liquid crystal display device, liquid crystal cell, transparent substrate, and method of manufacturing liquid crystal cell Kenji Tsuboi 2010-09-21
7755772 Tire shape measuring system Eiji Takahashi, Naokazu Sakoda 2010-07-13
7724377 Apparatus and method for detecting tire shape Naokazu Sakoda, Eiji Takahashi, Yasuhiro Matsushita, Toshikatsu Nonaka, Shiro Horiguchi 2010-05-25
7715022 Apparatus and method for measuring shape Eiji Takahashi, Masato Kannaka 2010-05-11
7522287 Photothermal conversion measurement apparatus, photothermal conversion measurement method, and sample cell Eiji Takahashi, Hiroyuki Takamatsu, Masato Kannaka, Naokazu Sakoda 2009-04-21
7060749 Polyester composition, films made thereof and process for producing the composition Yoshihiro Honma, Minoru Yoshida 2006-06-13
6716521 Polyester composition, film made thereof, and magnetic recording medium Toshihiro Tsuzuki, Tai Sasamoto 2004-04-06
6468627 Polyester film for magnetic recording medium, and magnetic recording tape Masaaki Ono, Katsuya Okamoto, Toshihiro Tsuzuki 2002-10-22
6048626 Polyester composition and film made therefrom Toshihiro Tsuzuki, Yuzo Shimizu, Takashi Ueda 2000-04-11
5943437 Method and apparatus for classifying a defect on a semiconductor wafer Shingo Sumie, Yuichiro Gotoh, Eiji Takahashi, Shouji Kanbe, Akira Okamoto 1999-08-24
5619326 Method of sample valuation based on the measurement of photothermal displacement Hiroyuki Takamatsu, Shingo Sumie, Naoyuki Yoshida 1997-04-08