Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8952338 | Crystalline quality evaluation apparatus for thin-film semiconductors, using μ-PCD technique | Naokazu Sakoda, Hiroyuki Takamatsu, Masahiro Inui | 2015-02-10 |
| 5760597 | Method of and apparatus for measuring lifetime of carriers in semiconductor sample | Naoyuki Yoshida, Hiroyuki Takamatsu, Shingo Sumie, Yutaka Kawata, Hidehisa Hashizume +1 more | 1998-06-02 |
| 5438276 | Apparatus for measuring the life time of minority carriers of a semiconductor wafer | Yutaka Kawata, Takuya Kusaka, Hidehisa Hashizume | 1995-08-01 |