Issued Patents All Time
Showing 26–41 of 41 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6947520 | Beam centering and angle calibration for X-ray reflectometry | Boris Yokhin, David Berman | 2005-09-20 |
| 6907108 | Dual-wavelength x-ray monochromator | Boris Yokhin, Amos Gvirtzman | 2005-06-14 |
| 6895071 | XRR detector readout processing | Boris Yokhin, Alexander Dikopoltsev, David Berman | 2005-05-17 |
| 6680996 | Dual-wavelength X-ray reflectometry | Boris Yokhin, Amos Gvirtzman | 2004-01-20 |
| 6639968 | X-ray reflectometer | Boris Yokhin, Alexander Dikopoltsev, David Berman | 2003-10-28 |
| 6556652 | Measurement of critical dimensions using X-rays | Boris Yokhin, Amos Gvirtzman | 2003-04-29 |
| 6512814 | X-ray reflectometer | Boris Yokhin, Alexander Dikopoltsev, David Berman | 2003-01-28 |
| 6453002 | Differential measurement of X-ray microfluorescence | Boris Yokhin, David Bar-On | 2002-09-17 |
| 6389102 | X-ray array detector | Amos Gvirtzman, Boris Yokhin, Ami Dovrat | 2002-05-14 |
| 6381303 | X-ray microanalyzer for thin films | Long Vu, Boris Yokhin, Amos Gvirtzman | 2002-04-30 |
| 6351516 | Detection of voids in semiconductor wafer processing | Long Vu | 2002-02-26 |
| 6184686 | Contamination and residuals inspection system | Amos Gvirtzman, Reuven Duer | 2001-02-06 |
| 6108398 | X-ray microfluorescence analyzer | Amos Gvirtzman, Boris Yokhin | 2000-08-22 |
| 5740953 | Method and apparatus for cleaving semiconductor wafers | Colin Smith, Kalman Kaufman, Elik Chen, Dan Vilenski | 1998-04-21 |
| 5438413 | Process for measuring overlay misregistration during semiconductor wafer fabrication | Noam Knoll, Yoram Uziel | 1995-08-01 |
| 5112129 | Method of image enhancement for the coherence probe microscope with applications to integrated circuit metrology | Mark Davidson, Kalman Kaufman | 1992-05-12 |