Issued Patents All Time
Showing 51–75 of 87 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7489400 | System and method of applying xenon arc-lamps to provide 193 nm wavelengths | Ping He, Martin M. Liphardt | 2009-02-10 |
| 7477388 | Sample masking in ellipsometer and the like systems including detection of substrate backside reflections | Martin M. Liphardt, Corey L. Bungay, John A. Woollam | 2009-01-13 |
| 7426030 | Reduced gas flow purging system in reflectometer, ellipsometer, polarimeter and the like systems | Martin M. Liphardt | 2008-09-16 |
| 7385698 | System and method of selectively monitoring sample front and backside reflections in ellipsometer and the like systems | John A. Woollam, Martin M. Liphardt | 2008-06-10 |
| D566499 | Flip-flop sandal bottle opener | — | 2008-04-15 |
| D565371 | Surfboard bottle opener | — | 2008-04-01 |
| 7345762 | Control of beam spot size in ellipsometer and the like systems | Martin M. Liphardt, Blaine D. Johs, John A. Woollam, Duane E. Meyer | 2008-03-18 |
| D563038 | Las Vegas sign lighter | — | 2008-02-26 |
| D563039 | Palm tree lighter | — | 2008-02-26 |
| D560030 | Longboard lighter | — | 2008-01-15 |
| 7317529 | Aspects of producing, directing, conditioning, impinging and detecting spectroscopic electromagnetic radiation from small spots on samples | Martin M. Liphardt, Ping He, Blaine D. Johs, Galen L. Pfeiffer, John A. Woollam | 2008-01-08 |
| 7283234 | Use of ellipsometry and surface plasmon resonance in monitoring thin film deposition or removal from a substrate surface | John A. Woollam, Blaine D. Johs, Thomas E. Tiwald, Martin M. Liphardt | 2007-10-16 |
| 7277171 | Flying mobile on-board ellipsometer, polarimeter, reflectometer and the like systems | Blaine D. Johs, Ping He, Martin M. Liphardt, Christopher A. Goeden, John A. Woollam | 2007-10-02 |
| 7265838 | Method of calibrating effects of multi-AOI-system for easy changing angles-of-incidence in ellipsometers and the like | Blaine D. Johs, Ping He, Martin M. Liphardt, Christopher A. Goeden, John A. Woollam | 2007-09-04 |
| 7253900 | Ellipsometer or polarimeter and the like system with multiple detector element detector in environmental control chamber including secure sample access | John A. Woollam, Gregory K. Pribil, Martin M. Liphardt | 2007-08-07 |
| 7215423 | Control of beam spot size in ellipsometer and the like systems | Martin M. Liphardt, Blaine D. Johs, John A. Woollam | 2007-05-08 |
| 7209234 | Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of material deposited from a fluid | John A. Woollam | 2007-04-24 |
| 7151605 | Methodology for providing good data at all wavelengths over a spectroscopic range | Craig M. Herzinger, Steven E. Green, Ronald A. Synowicki | 2006-12-19 |
| 7057717 | System for and method of investigating the exact same point on a sample substrate with at least two wavelengths | Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger, Ping He, Christopher A. Goeden +1 more | 2006-06-06 |
| 7030982 | Combined use of oscillating means and ellipsometry to determine uncorrelated effective thickness and optical constants of accumulated material | John A. Woollam | 2006-04-18 |
| 6930813 | Spatial filter source beam conditioning in ellipsometer and the like systems | Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger, Ping He | 2005-08-16 |
| 6859278 | Multi-AOI-system for easy changing angles-of-incidence in ellipsometer, polarimeter and reflectometer systems | Blaine D. Johs, Ping He, Martin M. Liphardt, Christopher A. Goeden, John A. Woollam | 2005-02-22 |
| D498326 | Lighter | — | 2004-11-09 |
| 6624493 | Biasing, operation and parasitic current limitation in single device equivalent to CMOS, and other semiconductor systems | — | 2003-09-23 |
| 6590655 | System and method of improving electromagnetic radiation beam characteristics in ellipsometer and the like systems | Blaine D. Johs, Martin M. Liphardt, Ping He | 2003-07-08 |