Issued Patents All Time
Showing 26–42 of 42 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7796260 | System and method of controlling intensity of an electromagnetic beam | Blaine D. Johs, Christopher A. Goeden | 2010-09-14 |
| 7633625 | Spectroscopic ellipsometer and polarimeter systems | John A. Woollam, Blaine D. Johs, Craig M. Herzinger, Ping He, Martin M. Liphardt | 2009-12-15 |
| 7616319 | Spectroscopic ellipsometer and polarimeter systems | John A. Woollam, Blaine D. Johs, Craig M. Herzinger, Ping He, Martin M. Liphardt | 2009-11-10 |
| 7535566 | Beam chromatic shifting and directing means | Blaine D. Johs, Jeffrey S. Hale, Christopher A. Goeden, Brian D. Guenther, Martin M. Liphardt +1 more | 2009-05-19 |
| 7508510 | System for and method of investigating the exact same point on a sample substrate with multiple wavelengths | Martin M. Liphardt, Blaine D. Johs, Craig M. Herzinger, Christopher A. Goeden, Ping He +2 more | 2009-03-24 |
| 7349092 | System for reducing stress induced effects during determination of fluid optical constants | Thomas E. Tiwald, John A. Woollam, Blaine D. Johs, Craig M. Herzinger | 2008-03-25 |
| 7327456 | Spectrophotometer, ellipsometer, polarimeter and the like systems | John A. Woollam, Steven E. Green, Ping He, Blaine D. Johs, Craig M. Herzinger +3 more | 2008-02-05 |
| 7317529 | Aspects of producing, directing, conditioning, impinging and detecting spectroscopic electromagnetic radiation from small spots on samples | Martin M. Liphardt, Ping He, Blaine D. Johs, James D. Welch, John A. Woollam | 2008-01-08 |
| 7301631 | Control of uncertain angle of incidence of beam from Arc lamp | Blaine D. Johs, Ping He, Steven E. Green, Christopher A. Goeden, Martin M. Liphardt | 2007-11-27 |
| 7274450 | Sample entry purge system in spectrophotometer, ellipsometer, polarimeter and the like systems | Steven E. Green, Ping He, Brian D. Guenther, Gerald T. Cooney, John A. Woollam +3 more | 2007-09-25 |
| 7265835 | System for implementing variable retarder capability in ellipsometer, polarimeter or the like systems | Craig M. Herzinger | 2007-09-04 |
| 7158231 | Spectroscopic ellipsometer and polarimeter systems | John A. Woollam, Blaine D. Johs, Craig M. Herzinger, Ping He, Martin M. Liphardt | 2007-01-02 |
| 7136162 | Alignment of ellipsometer beam to sample surface | Martin M. Liphardt, Craig M. Herzinger, Brian D. Guenther, Steven E. Green, Ping He | 2006-11-14 |
| 7136172 | System and method for setting and compensating errors in AOI and POI of a beam of EM radiation | Blaine D. Johs, Christopher A. Goeden, Martin M. Liphardt | 2006-11-14 |
| 7099006 | Ellipsometer or polarimeter and the like system with beam chromatic shifting and directing means | Blaine D. Johs, Jeffrey S. Hale, Christopher A. Goeden | 2006-08-29 |
| 6982792 | Spectrophotometer, ellipsometer, polarimeter and the like systems | John A. Woollam, Steven E. Green, Ping He, Blaine D. Johs, Craig M. Herzinger +2 more | 2006-01-03 |
| 6937341 | System and method enabling simultaneous investigation of sample with two beams of electromagnetic radiation | John A. Woollam, Daniel W. Thompson, Blaine D. Johs, Craig M. Herzinger | 2005-08-30 |