Issued Patents All Time
Showing 1–16 of 16 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11187349 | Micro electrical mechanical system (MEMS) valve | Daniel Piper, Jonathan Fry, Jang Sim | 2021-11-30 |
| 11161110 | MEMS optical liquid level sensor | Jonathan Fry, Daniel Piper, Jang Sim | 2021-11-02 |
| 10898871 | Micro electrical mechanical system (MEMS) multiplexing mixing | Jonathan Fry, Daniel Piper, Jang Sim | 2021-01-26 |
| 10612691 | Micro electrical mechanical system (MEMS) valve | Jonathan Fry, Daniel Piper, Jang Sim | 2020-04-07 |
| 10551240 | Self-cleaning liquid level sensor | Jonathan Fry, Daniel Piper, Jang Sim | 2020-02-04 |
| 10458909 | MEMS optical sensor | Jonathan Fry, Daniel Piper, Jang Sim | 2019-10-29 |
| 10415721 | Micro electrical mechanical system (MEMS) valve | Daniel Piper, Jonathan Fry, Jang Sim | 2019-09-17 |
| 9780007 | LCR test circuit structure for detecting metal gate defect conditions | Xu Ouyang, Yunsheng Song, Tso-Hui Ting | 2017-10-03 |
| 9702930 | Semiconductor wafer probing system including pressure sensing and control unit | Robert D. Edwards, Oleg Gluschenkov, Louis V. Medina, Tso-Hui Ting, Ping-Chuan Wang | 2017-07-11 |
| 9559051 | Method for manufacturing in a semiconductor device a low resistance via without a bottom liner | Jang Sim, Junjing Bao, Zhigang Song, Yunsheng Song | 2017-01-31 |
| 9519210 | Voltage contrast characterization structures and methods for within chip process variation characterization | Oliver D. Patterson, Yunsheng Song, Zhigang Song | 2016-12-13 |
| 9354252 | Pressure sensing and control for semiconductor wafer probing | Robert D. Edwards, Oleg Gluschenkov, Louis V. Medina, Tso-Hui Ting, Ping-Chuan Wang | 2016-05-31 |
| 8963567 | Pressure sensing and control for semiconductor wafer probing | Robert D. Edwards, Oleg Gluschenkov, Louis V. Medina, Tso-Hui Ting, Ping-Chuan Wang | 2015-02-24 |
| 8803328 | Random coded integrated circuit structures and methods of making random coded integrated circuit structures | Yunsheng Song, Keith Kwong Hon Wong, Zhijian Yang | 2014-08-12 |
| 8742782 | Noncontact electrical testing with optical techniques | Xu Ouyang, Tso-Hui Ting, Ping-Chuan Wang | 2014-06-03 |
| 8489225 | Wafer alignment system with optical coherence tomography | Xu Ouyang, Yunsheng Song, Tso-Hui Ting | 2013-07-16 |