Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11187349 | Micro electrical mechanical system (MEMS) valve | Yongchun Xin, Jonathan Fry, Jang Sim | 2021-11-30 |
| 11161110 | MEMS optical liquid level sensor | Jonathan Fry, Yongchun Xin, Jang Sim | 2021-11-02 |
| 11056439 | Optical chip ID definition using nanoimprint lithography | — | 2021-07-06 |
| 10898871 | Micro electrical mechanical system (MEMS) multiplexing mixing | Jonathan Fry, Jang Sim, Yongchun Xin | 2021-01-26 |
| 10612691 | Micro electrical mechanical system (MEMS) valve | Yongchun Xin, Jonathan Fry, Jang Sim | 2020-04-07 |
| 10551240 | Self-cleaning liquid level sensor | Jonathan Fry, Jang Sim, Yongchun Xin | 2020-02-04 |
| 10458909 | MEMS optical sensor | Jonathan Fry, Jang Sim, Yongchun Xin | 2019-10-29 |
| 10453800 | Optical chip ID definition using nanoimprint lithography | — | 2019-10-22 |
| 10415721 | Micro electrical mechanical system (MEMS) valve | Yongchun Xin, Jonathan Fry, Jang Sim | 2019-09-17 |
| 10242951 | Optical electronic-chip identification writer using dummy C4 bumps | — | 2019-03-26 |
| 9564382 | Test structure for determining overlay accuracy in semiconductor devices using resistance measurement | — | 2017-02-07 |
| 9252202 | Test structure and method for determining overlay accuracy in semiconductor devices using resistance measurement | — | 2016-02-02 |
| 9035418 | Nitride shallow trench isolation (STI) structures | Franklin Chiang, Ganesh Yerubandi | 2015-05-19 |
| 8841676 | Vertical integrated semiconductor device with multiple continuous single crystal silicon layers vertically separated from one another | — | 2014-09-23 |
| 8546250 | Method of fabricating vertical integrated semiconductor device with multiple continuous single crystal silicon layers vertically separated from one another | — | 2013-10-01 |
| 8530327 | Nitride shallow trench isolation (STI) structures and methods for forming the same | Franklin Chiang, Ganesh Yerubandi | 2013-09-10 |
| 7631286 | Automated metrology recipe generation | Scott Westfall | 2009-12-08 |