YV

Yonatan Vaknin

KL Kla: 7 patents #45 of 758Top 6%
Overall (All Time): #687,517 of 4,157,543Top 20%
7
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12422363 Scanning scatterometry overlay metrology Amnon Manassen, Andrew V. Hill, Yuri Paskover, Itay Gdor, Yuval Lubashevsky 2025-09-23
12399435 Grating-over-grating overlay measurement with parallel color per layer Amnon Manassen 2025-08-26
12066322 Single grab overlay measurement of tall targets Amnon Manassen, Andrew V. Hill, Avner Safrani 2024-08-20
12032300 Imaging overlay with mutually coherent oblique illumination Andrew V. Hill, Vladimir Levinski, Daria Negri, Amnon Manassen 2024-07-09
12001148 Enhancing performance of overlay metrology Amnon Manassen, Andrew V. Hill, Yossi Simon, Daria Negri, Vladimir Levinski +9 more 2024-06-04
11800212 Multi-directional overlay metrology using multiple illumination parameters and isolated imaging Andrew V. Hill, Amnon Manassen 2023-10-24
11592755 Enhancing performance of overlay metrology Amnon Manassen, Andrew V. Hill, Yossi Simon, Daria Negri, Vladimir Levinski +9 more 2023-02-28