Issued Patents All Time
Showing 1–25 of 31 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9506872 | Inspection apparatus | Yuta Urano, Toshiyuki Nakao | 2016-11-29 |
| 8934092 | Surface defect inspection method and apparatus | Toshiyuki Nakao, Shigeru Matsui | 2015-01-13 |
| 8705026 | Inspection apparatus | Yuta Urano, Toshiyuki Nakao | 2014-04-22 |
| 8654350 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Shunji Maeda, Hisae Shibuya, Yuta Urano, Toshiyuki Nakao +1 more | 2014-02-18 |
| 8482727 | Defect inspection method | Toshiyuki Nakao, Yuta Urano | 2013-07-09 |
| 8477302 | Defect inspection apparatus | Yuta Urano, Toshiyuki Nakao, Akira Hamamatsu | 2013-07-02 |
| 8400629 | Surface defect inspection method and apparatus | Toshiyuki Nakao, Shigeru Matsui | 2013-03-19 |
| 8314929 | Method and its apparatus for inspecting defects | Yuta Urano, Toshiyuki Nakao | 2012-11-20 |
| 8310665 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Shunji Maeda, Hisae Shibuya, Yuta Urano, Toshiyuki Nakao +1 more | 2012-11-13 |
| 8264679 | Inspection apparatus | Yuta Urano, Toshiyuki Nakao | 2012-09-11 |
| 8218138 | Apparatus and method for inspecting defects | Hiroyuki Nakano, Akira Hamamatsu, Sachio Uto, Hidetoshi Nishiyama, Yuta Urano +1 more | 2012-07-10 |
| 8144337 | Inspecting method and inspecting apparatus for substrate surface | Akira Hamamatsu, Shunji Maeda, Hisae Shibuya, Yuta Urano, Toshiyuki Nakao +1 more | 2012-03-27 |
| 8120766 | Inspection apparatus | Yuta Urano, Toshiyuki Nakao | 2012-02-21 |
| 8115915 | Defect inspection method and apparatus | Toshiyuki Nakao, Yuta Urano | 2012-02-14 |
| 8035808 | Surface defect inspection method and apparatus | Toshiyuki Nakao, Shigeru Matsui | 2011-10-11 |
| 7973920 | Apparatus and method for inspecting defects | Hiroyuki Nakano, Akira Hamamatsu, Sachio Uto, Hidetoshi Nishiyama, Yuta Urano +1 more | 2011-07-05 |
| 7970199 | Method and apparatus for detecting defect on a surface of a specimen | Minoru Yoshida | 2011-06-28 |
| 7965386 | Method and its apparatus for inspecting defects | Yuta Urano, Toshiyuki Nakao | 2011-06-21 |
| 7916288 | Defect inspection method | Toshiyuki Nakao, Yuta Urano | 2011-03-29 |
| 7869024 | Method and its apparatus for inspecting defects | Yuta Urano, Toshiyuki Nakao | 2011-01-11 |
| 7768635 | Apparatus and method for inspecting defects | Hiroyuki Nakano, Akira Hamamatsu, Sachio Uto, Hidetoshi Nishiyama, Yuta Urano +1 more | 2010-08-03 |
| 7719673 | Defect inspecting device for sample surface and defect detection method therefor | Toshiyuki Nakao | 2010-05-18 |
| 7710557 | Surface defect inspection method and apparatus | Toshiyuki Nakao, Shigeru Matsui | 2010-05-04 |
| 7675613 | Defect inspection method | Toshiyuki Nakao, Yuta Urano | 2010-03-09 |
| 7333192 | Apparatus and method for inspecting defects | Hiroyuki Nakano, Akira Hamamatsu, Sachio Uto, Hidetoshi Nishiyama, Yuta Urano +1 more | 2008-02-19 |