YO

Yoshihisa Ooae

AD Advantest: 15 patents #43 of 1,193Top 4%
Fujitsu Limited: 6 patents #5,180 of 24,456Top 25%
DK Denki Kagaku Kogyo: 1 patents #291 of 655Top 45%
Overall (All Time): #235,551 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11295925 Electron gun device Hiroshi Yasuda, Tatsuya Shibaoka, Hidekazu Murata 2022-04-05
8530857 Stage device Youichi Shimizu 2013-09-10
8390201 Multi-column electron beam exposure apparatus and magnetic field generation device Hiroshi Yasuda, Takeshi Haraguchi 2013-03-05
7919750 Electron gun, electron beam exposure apparatus, and exposure method Hiroshi Yasuda, Takeshi Haraguchi, Takamasa Satoh, Yoshinori Terui, Seiichi Sakawa +1 more 2011-04-05
7777202 Electron beam exposure apparatus involving the position and velocity calculation Takamasa Satoh 2010-08-17
7737421 Electron beam exposure apparatus and method for cleaning the same Hiroshi Yasuda 2010-06-15
6911780 Electron beam, generating device, and testing device Yoichi Shimizu 2005-06-28
6727658 Electron beam generating apparatus and electron beam exposure apparatus Yoichi Shimizu, Takamasa Satoh, Takeshi Haraguchi 2004-04-27
6509568 Electrostatic deflector for electron beam exposure apparatus Hitoshi Tanaka, Takeshi Haraguchi, Kazuto Ashiwara, Tomohiko Abe, Ryoji Kato 2003-01-21
6465796 Charge-particle beam lithography system of blanking aperture array type Takeshi Haraguchi, Tomohiko Abe 2002-10-15
6407398 Electron beam exposure apparatus and exposure method Masaki Kurokawa, Tatsuro Ohkawa 2002-06-18
6268606 Electrostatic deflector, for electron beam exposure apparatus, with reduced charge-up Tomohiko Abe, Hiroshi Yasuda 2001-07-31
6252344 Electron gun used in an electron beam exposure apparatus Takamasa Satoh, Akio Yamada, Hiroshi Yasuda 2001-06-26
6046459 Method and system for charged particle beam exposure Nobuyuki Yasutake, Kazushi Ishida, Hiroshi Yasuda, Akiyoshi Tsuda, Hitoshi Tanaka 2000-04-04
6008495 Electron beam exposure device Hitoshi Tanaka 1999-12-28
5981118 Method for charged particle beam exposure with fixed barycenter through balancing stage scan Nobuyuki Yasutake, Kazushi Ishida, Hiroshi Yasuda, Akiyoshi Tsuda, Hitoshi Tanaka 1999-11-09
5945683 Electron beam exposure device Tatsuro Ohkawa, Hitoshi Tanaka, Hiroshi Yasuda 1999-08-31
5892237 Charged particle beam exposure method and apparatus Kenichi Kawakami, Hiroshi Yasuda, Akio Yamada, Tatsuro Ohkawa, Mitsuhiro Nakano +1 more 1999-04-06
5708276 Electron-beam exposure device and a method of detecting a mark position for the device Tatsuro Ohkawa, Kawakami Kenichi, Tohru Ikeda, Kazushi Ishida 1998-01-13