Issued Patents All Time
Showing 1–22 of 22 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10370880 | Locking device for opening and closing lid | Akira Masuda, Hideyuki Matsuura | 2019-08-06 |
| 10157722 | Inspection device | Masahiro Hatakeyama, Shoji Yoshikawa, Takeshi Murakami, Kenji Watanabe, Yasushi Toma +5 more | 2018-12-18 |
| 9966227 | Specimen observation method and device using secondary emission electron and mirror electron detection | Masahiro Hatakeyama, Takeshi Murakami, Kenji Terao, Norio Kimura, Kenji Watanabe | 2018-05-08 |
| 9749725 | Wireless microphone with antenna therein | Akira Masuda | 2017-08-29 |
| 9615157 | Microphone | Akira Masuda | 2017-04-04 |
| 9194826 | Electron beam apparatus and sample observation method using the same | Toru Kaga, Kenji Terao, Masahiro Hatakeyama, Kenji Watanabe, Takeshi Murakami +1 more | 2015-11-24 |
| 9105444 | Electro-optical inspection apparatus and method with dust or particle collection function | Kenji Watanabe, Masahiro Hatakeyama, Tatsuya Kohama, Kenji Terao, Takeshi Murakami +4 more | 2015-08-11 |
| 8937283 | Specimen observation method and device using secondary emission electron and mirror electron detection | Masahiro Hatakeyama, Takeshi Murakami, Kenji Terao, Norio Kimura, Kenji Watanabe | 2015-01-20 |
| 8859984 | Method and apparatus for inspecting sample surface | Nobuharu Noji, Hirosi Sobukawa, Kenji Terao, Masahiro Hatakeyama, Katsuya Okumura | 2014-10-14 |
| 8624182 | Electro-optical inspection apparatus and method with dust or particle collection function | Kenji Watanabe, Masahiro Hatakeyama, Tatsuya Kohama, Kenji Terao, Takeshi Murakami +4 more | 2014-01-07 |
| 8525127 | Method and apparatus for inspecting sample surface | Nobuharu Noji, Hirosi Sobukawa, Kenji Terao, Masahiro Hatakeyama, Katsuya Okumura | 2013-09-03 |
| 8497940 | High density wireless system | Bob Green, Masahiko Igarashi, Tadashi Kikutani | 2013-07-30 |
| 8497476 | Inspection device | Masahiro Hatakeyama, Shoji Yoshikawa, Takeshi Murakami, Kenji Watanabe, Yasushi Toma +5 more | 2013-07-30 |
| 8274047 | Substrate surface inspection method and inspection apparatus | Norio Kimura, Kenji Terao, Masahiro Hatakeyama, Masamitsu Itoh | 2012-09-25 |
| 7952071 | Apparatus and method for inspecting sample surface | Nobuharu Noji, Hirosi Sobukawa, Masahiro Hatakeyama, Kenji Terao, Takeshi Murakami +2 more | 2011-05-31 |
| 7829853 | Sample surface observation method | Kenji Watanabe, Masahiro Hatakeyama, Kenji Terao | 2010-11-09 |
| 6960270 | Optical disk producing device and producing method | Yutaka Matsumoto, Hironobu Nishimura, Masahiko Kotoyori, Koji Yamaguchi | 2005-11-01 |
| 6614037 | Electron beam irradiating apparatus | — | 2003-09-02 |
| 6329769 | Electron beam irradiation device | — | 2001-12-11 |
| 5743965 | Disk coating system | Hironobu Nishimura, Naozumi MIZUTANI, Masahiko Kotoyori, Katumi Yamaguchi | 1998-04-28 |
| 5721428 | Magnetic field type mass spectrometer | Kazutoshi Nagai, Osamu Horita | 1998-02-24 |
| 5565680 | High frequency mass spectrometer | Osamu Horita, Kazutoshi Nagai | 1996-10-15 |