Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11576634 | Systems and methods for controlling motion of detectors having moving detector heads | Jean-Paul Bouhnik, Gil Kovalski, Yariv Grobshtein, Riyad Mahameed, Yaron Hefetz +3 more | 2023-02-14 |
| 11160519 | Methods and apparatus for imaging with detectors having moving detector heads | Yaron Hefetz | 2021-11-02 |
| 10492745 | Systems and methods for controlling motion of detectors having moving detector heads | Jean-Paul Bouhnik, Gil Kovalski, Yariv Grobshtein, Riyad Mahameed, Yaron Hefetz +3 more | 2019-12-03 |
| 10159456 | Systems and methods for biopsy guidance using a biopsy unit including at least one of an imaging detector or ultrasound probe concurrently mounted with a biopsy guide | Ira Blevis | 2018-12-25 |
| 10098596 | Methods and apparatus for imaging with detectors having moving detector heads | Yaron Hefetz | 2018-10-16 |
| 9693744 | Methods and apparatus for imaging with detectors having moving detector heads | Yaron Hefetz | 2017-07-04 |
| 9662079 | Methods and apparatus for imaging with detectors having moving detector heads | Yaron Hefetz | 2017-05-30 |
| 7649978 | Automated selection of X-ray reflectometry measurement locations | Isaac Mazor, Alex Dikopoltsev, Boris Yokhin, Dileep Agnihotri, Alex Tokar +2 more | 2010-01-19 |
| 7551719 | Multifunction X-ray analysis system | Boris Yokhin, Alexander Krokhmal, Isaac Mazor, Amos Gvirtzman | 2009-06-23 |
| 7245695 | Detection of dishing and tilting using X-ray fluorescence | Isaac Mazor, Alex Dikopoltsev, Boris Yokhin, Alex Tokar | 2007-07-17 |
| 7120228 | Combined X-ray reflectometer and diffractometer | Boris Yokhin, Isaac Mazor | 2006-10-10 |
| 7023954 | Optical alignment of X-ray microanalyzers | Isaac Mazor | 2006-04-04 |
| 6895075 | X-ray reflectometry with small-angle scattering measurement | Boris Yokhin, Alexander Dikopoltsev, Amos Gvirtzman | 2005-05-17 |