SI

Sukehiro Ito

HH Hitachi High-Technologies: 32 patents #39 of 1,917Top 3%
SE Seiko Epson: 15 patents #1,253 of 7,774Top 20%
HS Hitachi Science Systems: 2 patents #12 of 77Top 20%
TO Toto: 1 patents #620 of 1,113Top 60%
Overall (All Time): #57,782 of 4,157,543Top 2%
48
Patents All Time

Issued Patents All Time

Showing 25 most recent of 48 patents

Patent #TitleCo-InventorsDate
12377652 Liquid ejection apparatus and print head 2025-08-05
12358281 Liquid ejection apparatus and print head Masayuki Kawakami 2025-07-15
11958289 Liquid ejecting head control circuit and liquid ejecting apparatus 2024-04-16
11198289 Liquid discharge head control circuit, liquid discharge head, and liquid discharge apparatus Hideaki Nishimura 2021-12-14
11034146 Liquid discharge head control circuit, liquid discharge head, and liquid discharge apparatus Hideaki Nishimura 2021-06-15
10773521 Cable group and cable 2020-09-15
10773519 Liquid ejecting apparatus 2020-09-15
10744761 Liquid ejecting apparatus Kazunori Hiramatsu 2020-08-18
10464314 Liquid discharging apparatus and circuit substrate Masashi Asakawa, Kazunori Hiramatsu 2019-11-05
10241062 Charged particle beam device, sample observation method, sample platform, observation system, and light emitting member Yusuke Ominami, Mitsugu Sato, Kenko Uchida, Sadamitsu Aso, Taku Sakazume +2 more 2019-03-26
10160202 Liquid discharging apparatus Naoto Hayakawa, Kazunori Hiramatsu 2018-12-25
9824854 Charged particle beam device, image generation method, observation system Yusuke Ominami, Junichi Katane, Shinsuke Kawanishi 2017-11-21
9673020 Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sample Yusuke Ominami, Tomohisa Ohtaki 2017-06-06
9543111 Charged particle beam device Yusuke Ominami, Masami Katsuyama 2017-01-10
9508527 Sample base, charged particle beam device and sample observation method Yusuke Ominami, Takashi Ohshima 2016-11-29
9466460 Charged particle-beam device and specimen observation method Yusuke Ominami, Taku Sakazume 2016-10-11
9466457 Observation apparatus and optical axis adjustment method Yusuke Ominami, Mami Konomi, Shinsuke Kawanishi 2016-10-11
9418818 Charged particle beam device and sample observation method Yusuke Ominami 2016-08-16
9287083 Charged particle beam device Shinichi Tomita, Wataru Kotake 2016-03-15
9263232 Charged particle beam device Yusuke Ominami, Shinsuke Kawanishi, Tomohisa Ohtaki, Masahiko Ajima 2016-02-16
9236217 Inspection or observation apparatus and sample inspection or observation method Yusuke Ominami, Mami Konomi, Tomohisa Ohtaki, Shinsuke Kawanishi 2016-01-12
9208995 Charged particle beam apparatus Yusuke Ominami, Takashi Ohshima, Hiroyuki Ito, Mitsugu Sato 2015-12-08
9202667 Charged particle radiation device with bandpass detection Michio Hatano, Tetsuya Sawahata, Yasuko Watanabe, Mitsugu Sato, Takashi Ohshima +1 more 2015-12-01
9165741 Charged particle beam device, method for adjusting charged particle beam device, and method for inspecting or observing sample Yusuke Ominami, Tomohisa Ohtaki 2015-10-20
9105442 Charged particle beam apparatus Yusuke Ominami, Tomohisa Ohtaki 2015-08-11