SF

Stuart L. Friedman

KL Kla-Tencor: 8 patents #207 of 1,394Top 15%
Abbott: 3 patents #1,951 of 5,431Top 40%
Applied Materials: 2 patents #3,641 of 7,310Top 50%
HM Hansen Medical: 2 patents #51 of 76Top 70%
GA Gatan: 1 patents #34 of 60Top 60%
Overall (All Time): #235,421 of 4,157,543Top 6%
19
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
11262288 Beam shaping optics of flow cytometer systems and methods related thereto John Heanue 2022-03-01
10830686 Beam shaping optics of flow cytometer systems and methods related thereto John Heanue 2020-11-10
10473694 Optical source in microwave impedance microscopy Michael M. Kelly 2019-11-12
10274513 Optically excited microwave impedance microscopy Michael M. Kelly 2019-04-30
10274413 Beam shaping optics of flow cytometer systems and methods related thereto John Heanue 2019-04-30
9529279 Method and apparatus for inspecting a substrate David L. Adler, Kirk J. Bertsche, Mark A. McCord 2016-12-27
9523857 Beam shaping optics of flow cytometer systems and methods related thereto John Heanue 2016-12-20
9170503 Method and apparatus for inspecting a substrate David L. Adler, Kirk J. Bertsche, Mark A. McCord 2015-10-27
8941049 Readout methodology for multi-channel acquisition of spatially distributed signal Gabor Toth, Khashayar Shadman 2015-01-27
8629384 Photomultiplier tube optimized for surface inspection in the ultraviolet Stephen Biellak, Daniel Kavaldjiev 2014-01-14
8489184 System and method for determining electrode-tissue contact based on amplitude modulation of sensed signal Brian P. Wilfley, Joseph Anthony Heanue 2013-07-16
8237120 Transverse focusing action in hyperbolic field detectors Gabor Toth, Rudy F. Garcia, Mehran Nasser-Ghodsi, Khashayar Shadman, Ming Lun Yu 2012-08-07
8160690 System and method for determining electrode-tissue contact based on amplitude modulation of sensed signal Brian P. Wilfley, Joseph Anthony Heanue 2012-04-17
7635842 Method and instrument for chemical defect characterization in high vacuum Mehran Nasser-Ghodsi, Ming Lun Yu, Gabor Toth 2009-12-22
7570354 Image intensification for low light inspection Wei Zhao 2009-08-04
7171038 Method and apparatus for inspecting a substrate David L. Adler, Kirk J. Bertsche, Mark A. McCord 2007-01-30
6717146 Tandem microchannel plate and solid state electron detector Tai-Hon Philip Chang, Ming Lun Yu 2004-04-06
6642637 Parallel plate electron multiplier James Spallas 2003-11-04
5798524 Automated adjustment of an energy filtering transmission electron microscope Michael Karl Kundmann, Alexander Jozef Gubbens, Ondrej L. Krivanek 1998-08-25