Issued Patents All Time
Showing 1–24 of 24 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7596730 | Test method, test system and assist board | Yuya WATANABE, Hiroaki Yamoto | 2009-09-29 |
| 7209849 | Test system, added apparatus, and test method | Yuya WATANABE | 2007-04-24 |
| 7089135 | Event based IC test system | Rochit Rajsuman, Robert Sauer, Hiroaki Yamoto, James Alan Turnquist, Bruce R. Parnas +1 more | 2006-08-08 |
| 6678643 | Event based semiconductor test system | James Alan Turnquist, Hiroaki Yamoto | 2004-01-13 |
| 6668331 | Apparatus and method for successively generating an event to establish a total delay time that is greater than can be expressed by specified data bits in an event memory | Glen Gomes, Anthony Le, James Alan Turnquist, Rochit Rajusman | 2003-12-23 |
| 6651204 | Modular architecture for memory testing on event based test system | Rochit Rajsuman, Hiroaki Yamoto | 2003-11-18 |
| 6631340 | Application specific event based semiconductor memory test system | Koji Takahashi, Hiroaki Yamoto | 2003-10-07 |
| 6629282 | Module based flexible semiconductor test system | Rochit Rajsuman | 2003-09-30 |
| 6578169 | Data failure memory compaction for semiconductor test system | Anthony Le, Rochit Rajsuman, James Alan Turnquist | 2003-06-10 |
| 6567941 | Event based test system storing pin calibration data in non-volatile memory | James Alan Turnquist, Rochit Rajsuman | 2003-05-20 |
| 6545460 | Power source current measurement unit for semiconductor test system | — | 2003-04-08 |
| 6536006 | Event tester architecture for mixed signal testing | — | 2003-03-18 |
| 6532561 | Event based semiconductor test system | James Alan Turnquist, Rochit Rajsuman, Hiroaki Yamoto | 2003-03-11 |
| 6445208 | Power source current measurement unit for semiconductor test system | — | 2002-09-03 |
| 6404218 | Multiple end of test signal for event based test system | Anthony Le, James Alan Turnquist, Rochit Rajsuman | 2002-06-11 |
| 6377065 | Glitch detection for semiconductor test system | Anthony Le, Rochit Rajsuman, James Alan Turnquist | 2002-04-23 |
| 6331770 | Application specific event based semiconductor test system | — | 2001-12-18 |
| 6314034 | Application specific event based semiconductor memory test system | — | 2001-11-06 |
| 6185708 | Maintenance free test system | — | 2001-02-06 |
| 6172544 | Timing signal generation circuit for semiconductor test system | — | 2001-01-09 |
| 4497056 | IC Tester | — | 1985-01-29 |
| 4414665 | Semiconductor memory device test apparatus | Kenji Kimura, Kohji Ishikawa, Naoaki Narumi | 1983-11-08 |
| 4310802 | Logical waveform generator | Yoshichika Ichimiya, Tsuneta Sudo, Hiromi Maruyama, Susumu Sumida, Takashi Tokuno | 1982-01-12 |
| 4270116 | High speed data logical comparison device | Yoshichika Ichimiya, Tsuneta Sudo, Hiromi Maruyama, Susumu Sumida, Masao Shimizu +1 more | 1981-05-26 |