Issued Patents All Time
Showing 25 most recent of 67 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10224264 | High performance evaporation-condensation thermal spreading chamber for compute packages | Ali Akbar Merrikh, Mehdi Saeidi, Guoping Xu, Damion B. Gastelum, Luis Eduardo De Los Heros Beunza +1 more | 2019-03-05 |
| 10168222 | Thermal detector array configured to detect thermal radiation from the integrated circuit | Ali Akbar Merrikh | 2019-01-01 |
| 10132861 | Visible laser circuit fault isolation | Gaurav Sunil Mattey, Martin Villafana | 2018-11-20 |
| 9304308 | Laser scanning module including an optical isolator | — | 2016-04-05 |
| 8558565 | Wide area soft defect localization | Abdullah M. Yassine, Shannon B. Smith | 2013-10-15 |
| 8537464 | Optical isolation module and method for utilizing the same | — | 2013-09-17 |
| 8232586 | Silicon photon detector | Ronald M. Potok, Michael R. Bruce | 2012-07-31 |
| 8187772 | Solid immersion lens lithography | Michael R. Bruce | 2012-05-29 |
| 7884633 | Wide area soft defect localization | Ronald M. Potok, David E. Kloster, Norman E. Rhodes | 2011-02-08 |
| 7272010 | Thermally conductive integrated circuit mounting structures | Miguel Santana, Jr., Michael R. Bruce, Thomas Chu, Robert Powell | 2007-09-18 |
| 7235800 | Electrical probing of SOI circuits | Michael R. Bruce | 2007-06-26 |
| 7196800 | Semiconductor die analysis as a function of optical reflections from the die | Jeffrey D. Birdsley, Michael R. Bruce | 2007-03-27 |
| 6994584 | Thermally conductive integrated circuit mounting structures | Miguel Santana, Jr., Michael R. Bruce, Thomas Chu, Robert Powell | 2006-02-07 |
| 6992773 | Dual-differential interferometry for silicon device damage detection | Michael R. Bruce | 2006-01-31 |
| 6894518 | Circuit analysis and manufacture using electric field-induced effects | Michael R. Bruce | 2005-05-17 |
| 6891390 | Circuit analysis using electric field-induced effects | Michael R. Bruce | 2005-05-10 |
| 6873166 | Localized heating for defect isolation during die operation | Michael R. Bruce, Richard W. Johnson | 2005-03-29 |
| 6836132 | High resolution heat exchange | Michael R. Bruce, David H. Eppes | 2004-12-28 |
| 6833718 | Photon beacon | David Alan Bethke, Michael R. Bruce, Shawn M. McBride, Greg Dabney, Glen Gilfeather | 2004-12-21 |
| 6833716 | Electro-optical analysis of integrated circuits | Michael R. Bruce, Greg Dabney | 2004-12-21 |
| 6828809 | Photon detection enhancement of superconducting hot-electron photodetectors | Michael R. Bruce, Robert Powell, Brennan V. Davis, Thomas Chu, Miguel Santana, Jr. | 2004-12-07 |
| 6806166 | Substrate removal as a function of emitted photons at the back side of a semiconductor chip | Jeffrey D. Birdsley, Michael R. Bruce, Brennan V. Davis, Rosalinda M. Ring | 2004-10-19 |
| 6780664 | Nanotube tip for atomic force microscope | Michael R. Bruce, Thomas Chu, Miguel Santana, Jr., Robert Powell | 2004-08-24 |
| 6720641 | Semiconductor structure having backside probe points for direct signal access from active and well regions | Jeffrey D. Birdsley, Rosalinda M. Ring | 2004-04-13 |
| 6716683 | Optical analysis for SOI integrated circuits | Michael R. Bruce, Glen Gilfeather, Jiann Min Chin, Shawn M. McBride | 2004-04-06 |