Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8558565 | Wide area soft defect localization | Rama R. Goruganthu, Shannon B. Smith | 2013-10-15 |
| 7847575 | Method and apparatus for nano probing a semiconductor chip | Ronald M. Potok, Gregory A. Dabney | 2010-12-07 |
| 6465266 | Semiconductor device short analysis | Kola Olasupo | 2002-10-15 |
| 5835997 | Wafer shielding chamber for probe station | — | 1998-11-10 |