Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8296739 | Testing soft error rate of an application program | Ronald Nick Kalla, Jeffrey William Kellington, Todd A. Venton | 2012-10-23 |
| 8073668 | Method and apparatus for testing a full system integrated circuit design by statistical fault injection using hardware-based simulation | Jeffrey William Kellington, Prabhakar Kudva, John A. Schumann | 2011-12-06 |
| 7084660 | System and method for accelerated detection of transient particle induced soft error rates in integrated circuits | Theodore H. Zabel, Richard B. Bhend, David F. Heidel, Scott Barnett Swaney, Jerry D. Ackaret | 2006-08-01 |
| 6943578 | Method and application of PICA (picosecond imaging circuit analysis) for high current pulsed phenomena | Steven H. Voldman, Alan J. Weger | 2005-09-13 |