Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12392835 | Method of estimating state of charge of battery | Jake Kim, Giheon Kim, Sangwoo Kim, Youngbin Song | 2025-08-19 |
| 12387963 | Optical assembly for alignment inspection, optical apparatus including the same, die bonding system and die bonding method using the same | Jiyoung Chu, Hyungjin Kim, Wondon Joo, Sungmin Ahn, Jiyoung Kim +2 more | 2025-08-12 |
| 12366444 | Optical assembly for parallelism measurement, optical apparatus including the same, die bonding system and die bonding method using the same | Jiyoung Chu, Hyungjin Kim, Wondon Joo, Dongyoon Koo, Sangwoo Bae +3 more | 2025-07-22 |
| 12313393 | Level sensor and substrate processing apparatus including the same | Sungho Jang, Sangwoo Bae, Jangwoon Sung, Akinori Okubo, Seungwoo Lee +3 more | 2025-05-27 |
| 11946809 | Polarization measuring device and method of fabricating semiconductor device using the same | Ingi Kim, Sangwoo Bae, Akinori Okubo, Jungchul Lee, Eunhee Jeang | 2024-04-02 |
| 11898912 | Hyperspectral imaging (HSI) apparatus and inspection apparatus including the same | Sungho Jang, Jungchul Lee, Jinseob Kim, Gwangsik Park, Janghwi Lee +3 more | 2024-02-13 |
| 11823927 | Wafer inspection apparatus and system including the same | Kyunghun Han, Ingi Kim, Sangwoo Bae, Jungchul Lee, Myeongock Ko +3 more | 2023-11-21 |
| 11823961 | Substrate inspection system and method of manufacturing semiconductor device using substrate inspection system | Eunhee Jeang, BORIS AFINOGENOV, Sangwoo Bae, Wondon Joo, Maksim Riabko +7 more | 2023-11-21 |