AO

Akinori Okubo

Nissan Motor Co.: 7 patents #1,071 of 8,689Top 15%
Samsung: 5 patents #22,466 of 75,807Top 30%
RS Renault S.A.S.: 2 patents #206 of 1,209Top 20%
AD Adeka: 1 patents #257 of 499Top 55%
Overall (All Time): #334,028 of 4,157,543Top 9%
14
Patents All Time

Issued Patents All Time

Showing 1–14 of 14 patents

Patent #TitleCo-InventorsDate
12313393 Level sensor and substrate processing apparatus including the same Sungho Jang, Sangwoo Bae, Minhwan Seo, Jangwoon Sung, Seungwoo Lee +3 more 2025-05-27
12172389 Molding apparatus, manufacturing method, and fiber reinforced resin material Naohiro Fujita, Kazuhide MORINO, Masato INADOME, Masayoshi Goke, Takeshi SUKEMUNE +2 more 2024-12-24
12126329 Driving circuit Taku Shimomura, Keiichirou Numakura 2024-10-22
11946809 Polarization measuring device and method of fabricating semiconductor device using the same Ingi Kim, Minhwan Seo, Sangwoo Bae, Jungchul Lee, Eunhee Jeang 2024-04-02
11916469 Resonant power conversion device Taku Shimomura, Keiichiro Numakura 2024-02-27
11312091 Molding apparatus and manufacturing method Gaku Kimura, Takeshi SUKEMUNE, Yosuke Aragane 2022-04-26
11146163 Switching device and method for controlling switching device Taku Shimomura, Tetsuya Hayashi, Daiki Sato, Yuichi Iwasaki 2021-10-12
10816480 Method of detecting a defect on a substrate, apparatus for performing the same and method of manufacturing semiconductor device using the same Eun Hee Jeang, Aleksandr Sergeevich Shorokhov, Anton Sergeevich MEDVEDEV, Maksim Riabko, Sang Woo BAE +3 more 2020-10-27
10658940 Power converter Kentaro Shin, Kraisorn Throngnumchai, Tetsuya Hayashi 2020-05-19
10490622 Semiconductor capacitor Yasuaki Hayami, Tetsuya Hayashi, Yusuke Zushi, Wei Ni 2019-11-26
10476495 Drive device Taku Shimomura, Tetsuya Hayashi, Yuichi Iwasaki 2019-11-12
10401301 Optical test system and method, and method of manufacturing semiconductor device by using the optical test system and method Seongkeun Cho, Tae Hyun Kim, Sangwoo Bae, Janghwi Lee 2019-09-03
10312897 Switching device Throngnumchai Kraisorn, Kentaro Shin 2019-06-04
9880270 Test device and imaging device including the same Jae Hong Kim, Yoshihiko Hayashi 2018-01-30