Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7269280 | Method and its apparatus for inspecting a pattern | Takashi Hiroi, Masahiro Watanabe, Maki Tanaka, Asahiro Kuni, Chie Shishido +2 more | 2007-09-11 |
| 7049587 | Apparatus for inspecting a specimen | Takashi Hiroi, Masahiro Watanabe, Asahiro Kuni, Maki Tanaka, Munenori Fukunishi +2 more | 2006-05-23 |
| 6831998 | Inspection system for circuit patterns and a method thereof | Hiroya Koshishiba, Hideaki Doi, Kazushi Yoshimura, Haruomi Kobayashi, Chie Shishido | 2004-12-14 |
| 6566671 | Microscopic defect inspection apparatus and method thereof, as well as positional shift calculation circuit therefor | Atsushi Yoshida, Shunji Maeda, Takafumi Okabe, Hisashi Mizumoto | 2003-05-20 |
| 5430548 | Method and apparatus for pattern detection | Takashi Hiroi, Hitoshi Kubota, Shunji Maeda, Hiroshi Makihira | 1995-07-04 |
| 5144683 | Character recognition equipment | Hideaki Suzuki, Kichie Matsuzaki, Kazuo Kato, Mitsuo Oono, Kenzo Takeichi +3 more | 1992-09-01 |
| 5125044 | Image processing apparatus and method in which a plurality of access circuits can simultaneously perform access operations | Kouzou Nemoto, Minoru Makita, Kenzo Takeichi | 1992-06-23 |
| 5018219 | Object recognize apparatus | Kichie Matsuzaki, Kenzo Takeichi, Ryouichi Hisatomi, Masasi Kudou | 1991-05-21 |
| 4244539 | Perfect layer coil winding apparatus | Yukinori Taneda, Takashi Kobayashi, Kiyoshi Yano, Noboru Sugimoto | 1981-01-13 |