Issued Patents All Time
Showing 25 most recent of 60 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12390325 | Intraocular lens injector | Tu Cam Tran, Yinghui Wu, Stephen J. Van Noy | 2025-08-19 |
| 12390365 | Intraocular lens injector | Stephen J. Van Noy, David A. Downer, Yinghui Wu | 2025-08-19 |
| 12304884 | Photo-cleavable surfactants | Ying Ge, Song Jin, Tania Guardado Alvarez | 2025-05-20 |
| 12078646 | Strategy enabled by a photo-cleavable surfactant for extracellular vesicle proteomics | Ying Ge, Song Jin, Kevin Buck | 2024-09-03 |
| 11571294 | Intraocular lens injector | Tu Cam Tran, Yinghui Wu, Stephen J. Van Noy | 2023-02-07 |
| 11567085 | Photo-cleavable surfactants | Ying Ge, Song Jin, Tania Guardado Alvarez | 2023-01-31 |
| 11413187 | Intraocular lens injector | Stephen J. Van Noy, David A. Downer, Yinghui Wu | 2022-08-16 |
| 11000367 | Intraocular lens injector | Yinghui Wu, Tu Cam Tran, Douglas Brent Wensrich, Todd Taber, Jyoti Bhatia | 2021-05-11 |
| 10588780 | Intraocular lens injector | Stephen J. Van Noy, David A. Downer, Yinghui Wu | 2020-03-17 |
| 10568735 | Intraocular lens injector | Tu Cam Tran, Yinghui Wu, Stephen J. Van Noy | 2020-02-25 |
| 10555807 | Intraocular lens delivery device with telescoping plunger | Chris Belisle, Asif Fayyaz, Jian Liu | 2020-02-11 |
| 9927052 | Sanitary clamp with concealed threads | Tyler E. Robillard | 2018-03-27 |
| 9463089 | Plunger system for intraocular lens surgery | David A. Downer | 2016-10-11 |
| 9421092 | Automated intraocular lens injector device | David A. Downer, Sushant Muchhala, Stephen J. Van Noy, Dengzhua (Dan) Yan, Marshall Proulx | 2016-08-23 |
| 8979356 | Dual agitator mixer with sanitary tank | — | 2015-03-17 |
| 8961531 | Intraocular lens transfer case | Dengzhu Yan, David A. Downer | 2015-02-24 |
| 8502979 | Methods and systems for determining a critical dimension and overlay of a specimen | Ady Levy, Rodney Smedt, Gary Bultman, Mehrdad Nikoonahad, Dan Wack +2 more | 2013-08-06 |
| 8377076 | Lens delivery system | David A. Downer, Dengzhu Yan, Marshall Proulx, Sushant Muchhala, Tu Cam Tran | 2013-02-19 |
| 8179530 | Methods and systems for determining a critical dimension and overlay of a specimen | Ady Levy, Rodney Smedt, Gary Bultman, Mehrdad Nikoonahad, Dan Wack +2 more | 2012-05-15 |
| 7767956 | Methods and systems for lithography process control | Suresh Lakkapragada, Matt Hankinson, Ady Levy | 2010-08-03 |
| 7751046 | Methods and systems for determining a critical dimension and overlay of a specimen | Ady Levy, Rodney Smedt, Gary Bultman, Mehrdad Nikoonahad, Dan Wack +2 more | 2010-07-06 |
| 7462814 | Methods and systems for lithography process control | Suresh Lakkapragada, Matt Hankinson, Ady Levy | 2008-12-09 |
| 7460981 | Methods and systems for determining a presence of macro and micro defects on a specimen | Gary Bultman, Ady Levy, Mehrdad Nikoonahad, Dan Wack, John Fielden | 2008-12-02 |
| 7433047 | Runout characterization | David R. Peale, Dieter Mueller | 2008-10-07 |
| 7349090 | Methods and systems for determining a property of a specimen prior to, during, or subsequent to lithography | Dan Wack, Ady Levy, Gary Bultman, Mehrdad Nikoonahad, John Fielden | 2008-03-25 |