KB

Kirk J. Bertsche

KL Kla-Tencor: 17 patents #301 of 1,394Top 25%
AI Accuray Incorporated: 4 patents #45 of 146Top 35%
SU Siemens Medical Solutions Usa: 3 patents #393 of 1,486Top 30%
Overall (All Time): #171,630 of 4,157,543Top 5%
24
Patents All Time

Issued Patents All Time

Showing 1–24 of 24 patents

Patent #TitleCo-InventorsDate
11785699 Field replaceable, disposable, and thermally optimized X-ray target with integral beam current monitoring Mark E. Trail, Douglas Bourne 2023-10-10
11375601 Field replaceable, disposable, and thermally optimized X-ray target with integral beam current monitoring Mark E. Trail, Douglas Bourne 2022-06-28
11114269 Bremsstrahlung target for radiation therapy system Giorgio Asmerom, Miguel Gutierrez 2021-09-07
10636609 Bremsstrahlung target for radiation therapy system Giorgio Asmerom, Miguel Gutierrez 2020-04-28
9529279 Method and apparatus for inspecting a substrate David L. Adler, Mark A. McCord, Stuart L. Friedman 2016-12-27
9170503 Method and apparatus for inspecting a substrate David L. Adler, Mark A. McCord, Stuart L. Friedman 2015-10-27
8427185 Inline inspection of photovoltaics for electrical defects George H. Zapalac, Jr., David L. Brown, J. Kirkwood H. Rough, David Aitan Soltz, Yehiel Gotkis 2013-04-23
7906972 Inline inspection of photovoltaics for electrical defects George H. Zapalac, Jr., David L. Brown, J. Kirkwood H. Rough, David Aitan Soltz, Yehiel Gotkis 2011-03-15
7649365 Inline inspection of photovoltaics for electrical defects George H. Zapalac, Jr., David L. Brown, J. Kirkwood H. Rough, David Aitan Soltz, Yehiel Gotkis 2010-01-19
7507959 Method for charging substrate to a potential Mark A. McCord 2009-03-24
7446320 Electronically-variable immersion electrostatic lens Mark A. McCord, Francisco Machuca 2008-11-04
7394069 Large-field scanning of charged particles 2008-07-01
7391034 Electron imaging beam with reduced space charge defocusing Harald F. Hess 2008-06-24
7315022 High-speed electron beam inspection David L. Adler, Mark A. McCord, Mehdi Vaez-Iravani, Liqun Han 2008-01-01
7276694 Defect detection using energy spectrometer 2007-10-02
7253410 Charge-control pre-scanning for e-beam imaging John D. Greene 2007-08-07
7176468 Method for charging substrate to a potential Mark A. McCord 2007-02-13
7171038 Method and apparatus for inspecting a substrate David L. Adler, Mark A. McCord, Stuart L. Friedman 2007-01-30
7019292 E-beam detection of defective contacts/vias with flooding and energy filter Frank Fan, David L. Adler, Luca Grella 2006-03-28
6870172 Maskless reflection electron beam projection lithography Marian Mankos, Harald F. Hess, David L. Adler 2005-03-22
6822246 Ribbon electron beam for inspection system 2004-11-23
6646383 Monolithic structure with asymmetric coupling Chong Yao 2003-11-11
6487274 X-ray target assembly and radiation therapy systems and methods 2002-11-26
6407505 Variable energy linear accelerator 2002-06-18