Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11798827 | Systems and methods for semiconductor adaptive testing using inline defect part average testing | Robert J. Rathert, David W. Price, Chet V. Lenox, Oreste Donzella, John Robinson | 2023-10-24 |
| 11754625 | System and method for identifying latent reliability defects in semiconductor devices | David W. Price, Robert J. Rathert, Chet V. Lenox, Robert Cappel, Oreste Donzella | 2023-09-12 |
| 11293970 | Advanced in-line part average testing | David W. Price, Robert J. Rathert, John Robinson, Mike Von Den Hoff, Barry Saville +6 more | 2022-04-05 |
| 10761128 | Methods and systems for inline parts average testing and latent reliability defect detection | David W. Price, Robert J. Rathert, Robert Cappel, Douglas Sutherland | 2020-09-01 |
| 7453274 | Detection of defects using transient contrast | Lei Zhong, John Fretwell, Robert W. Fiordalice | 2008-11-18 |