JJ

John V. Jensen

Lsi Logic: 14 patents #102 of 1,957Top 6%
Overall (All Time): #323,633 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9072366 Utility bucket backpack apparatus Michael C. Gibbon 2015-07-07
7325222 Method and apparatus for verifying the post-optical proximity corrected mask wafer image sensitivity to reticle manufacturing errors Nadya Strelkova, Ebo Croffie 2008-01-29
7127698 Method for reducing reticle set cost 2006-10-24
7057261 Mixed LVR and HVR reticle set design for the processing of gate arrays, embedded arrays and rapid chip products Robert Muller, Mark C. Simmons 2006-06-06
7005217 Chromeless phase shift mask George E. Bailey, Neal Callan 2006-02-28
6900075 Mixed LVR and HVR reticle set design for the processing of gate arrays, embedded arrays and rapid chip products Robert Muller, Mark C. Simmons 2005-05-31
6532585 Method and apparatus for application of proximity correction with relative segmentation Dusan Petranovic, Ranko Scepanovic, Edwin Jones, Richard Schinella, Nicholas F. Pasch +3 more 2003-03-11
6499003 Method and apparatus for application of proximity correction with unitary segmentation Edwin Jones, Dusan Petranovic, Ranko Scepanovic, Richard Schinella, Nicholas F. Pasch +3 more 2002-12-24
6282696 Performing optical proximity correction with the aid of design rule checkers Mario Garza, Nicholas K. Eib, Keith K. Chao 2001-08-28
6269472 Optical proximity correction method and apparatus Mario Garza, Nicholas K. Eib, Keith K. Chao 2001-07-31
6174630 Method of proximity correction with relative segmentation Dusan Petranovic, Ranko Scepanovic, Edwin Jones, Richard Schinella, Nicholas F. Pasch +3 more 2001-01-16
6175953 Method and apparatus for general systematic application of proximity correction Ranko Scepanovic, Dusan Petranovic, Edwin Jones, Richard Schinella, Nicholas F. Pasch +3 more 2001-01-16
5900338 Performing optical proximity correction with the aid of design rule checkers Mario Garza, Nicholas K. Eib, Keith K. Chao 1999-05-04
5705301 Performing optical proximity correction with the aid of design rule checkers Mario Garza, Nicholas K. Eib, Keith K. Chao 1998-01-06
5703376 Multi-level resolution lithography 1997-12-30