Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7434198 | Method and computer program product for detecting potential failures in an integrated circuit design after optical proximity correction | Santosh Menon | 2008-10-07 |
| 7340706 | Method and system for analyzing the quality of an OPC mask | Ilya Golubtsov, Stanislav V. Aleshin, Ranko Scepanovic, Sergei Rodin, Marina Medvedeva +2 more | 2008-03-04 |
| 7325222 | Method and apparatus for verifying the post-optical proximity corrected mask wafer image sensitivity to reticle manufacturing errors | Ebo Croffie, John V. Jensen | 2008-01-29 |
| 7035446 | Quality measurement of an aerial image | Marina Medvedeva, Jaroslav Kalinin, Stanislav V. Aleshin | 2006-04-25 |
| 6775818 | Device parameter and gate performance simulation based on wafer image prediction | Kunal N. Taravade, Neal Callan | 2004-08-10 |