| 12100464 |
Repairable latch array |
Grady L. Giles |
2024-09-24 |
| 11841943 |
Tamper detection and response techniques |
Joshua Randall, Carl Wayne Vineyard, Mudit Bhargava |
2023-12-12 |
| 11657892 |
Repairable latch array |
Grady L. Giles |
2023-05-23 |
| 11520658 |
Non-volatile memory on chip |
Wendy Arnott Elsasser, Mudit Bhargava, Yew Keong Chong, George McNeil Lattimore, James Dennis Dodrill |
2022-12-06 |
| 11468945 |
3D storage architecture with tier-specific controls |
Rahul Mathur, Mudit Bhargava, Andy Wangkun Chen |
2022-10-11 |
| 11081469 |
Three-dimensional integrated circuit test and improved thermal dissipation |
Saurabh Sinha, Supreet Jeloka |
2021-08-03 |
| 10825745 |
Multi-die integrated circuits with improved testability |
Saurabh Sinha, Xiaoqing Xu, Mudit Bhargava |
2020-11-03 |
| 10761976 |
Method and apparatus for memory wear leveling |
Mudit Bhargava, Vikas Chandra |
2020-09-01 |
| 10521338 |
Method, system and device for memory device operation |
Mudit Bhargava, Alan Jeremy Becker |
2019-12-31 |
| 9953726 |
Fast quasi-parity checker for correlated electron switch (CES) memory array |
Mudit Bhargava |
2018-04-24 |
| 9891271 |
Techniques and circuits for testing a virtual power supply at an integrated circuit device |
Russell Schreiber, Sudha Thiruvengadam, Carl Dietz |
2018-02-13 |
| 9875815 |
Fast memory array repair using local correlated electron switch (CES) memory cells |
Mudit Bhargava |
2018-01-23 |
| 9767924 |
Fast memory array repair using local correlated electron switch (CES) memory cells |
Mudit Bhargava |
2017-09-19 |
| 8094476 |
Content addressable memory match signal test device and methods thereof |
Karthik Natarajan |
2012-01-10 |
| 7925937 |
Apparatus for testing embedded memory read paths |
Grady L. Giles, Alexander W. Schaefer, Gregory A. Constant, Floyd L. Dankert, Amy M. Novak |
2011-04-12 |
| 7724015 |
Data processing device and methods thereof |
Srinivasan Srinath, Sudhir Shrikantha Kudva |
2010-05-25 |