Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11836906 | Image processing system and computer program for performing image processing | Shinichi Shinoda, Yasutaka Toyoda, Shigetoshi Sakimura, Masayoshi Ishikawa, Hiroyuki Shindo | 2023-12-05 |
| 11443917 | Image generation method, non-transitory computer-readable medium, and system | Chikako Abe | 2022-09-13 |
| 11176405 | Image processing system and computer program for performing image processing | Shinichi Shinoda, Yasutaka Toyoda, Shigetoshi Sakimura, Masayoshi Ishikawa, Hiroyuki Shindo | 2021-11-16 |
| 10937628 | Charged particle beam device | Chikako Abe | 2021-03-02 |
| 10558127 | Exposure condition evaluation device | Shinichi Shinoda, Yasutaka Toyoda, Hiroyuki Ushiba | 2020-02-11 |
| 10445875 | Pattern-measuring apparatus and semiconductor-measuring system | Yasutaka Toyoda, Norio Hasegawa, Takeshi Kato, Yutaka Hojo, Daisuke Hibino +1 more | 2019-10-15 |
| 10190875 | Pattern measurement condition setting device and pattern measuring device | Shinichi Shinoda, Yasutaka Toyoda, Hiroyuki Ushiba | 2019-01-29 |
| 9990708 | Pattern-measuring apparatus and semiconductor-measuring system | Yasutaka Toyoda, Norio Hasegawa, Takeshi Kato, Yutaka Hojo, Daisuke Hibino +1 more | 2018-06-05 |
| 8959461 | Pattern measurement device and pattern measurement method | Takuma Shibahara, Michio Oikawa, Yutaka Hojo, Hiroyuki Shindo | 2015-02-17 |
| 8942464 | Pattern measuring apparatus, and pattern measuring method and program | Takuma Shibahara, Tsuyoshi Minakawa, Michio Oikawa, Yutaka Hojo, Hiroyuki Shindo | 2015-01-27 |