HN

Hideki Nasuno

Fujitsu Limited: 10 patents #3,161 of 24,456Top 15%
AD Advantest: 3 patents #330 of 1,193Top 30%
Overall (All Time): #379,884 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9859099 Exposure apparatus and exposure method Akio Yamada, Masahiro Seyama 2018-01-02
8779378 Electron beam detector, electron beam processing apparatus, and method of manufacturing electron beam detector Kenji Abe, Masaki Kurokawa, Akiyoshi Tsuda 2014-07-15
6784426 Electron beam irradiation apparatus, electron beam exposure apparatus, and defect detection method Takayuki Sugiura 2004-08-31
6646275 Charged particle beam exposure system and method Yoshihisa Oae, Tomohiko Abe, Soichiro Arai, Shigeru Maruyama, Hiroshi Yasuda +4 more 2003-11-11
6486479 Charged particle beam exposure system and method Yoshihisa Oae, Tomohiko Abe, Soichiro Arai, Shigeru Maruyama, Hiroshi Yasuda +4 more 2002-11-26
6242751 Charged-particle-beam exposure device and charged-particle-beam exposure method Akio Takemoto, Yoshihisa Ooaeh, Tomohiko Abe, Hiroshi Yasuda, Takamasa Satoh +7 more 2001-06-05
6118129 Method and system for exposing an exposure pattern on an object by a charged particle beam which is shaped into a plurality of beam elements Yoshihisa Oae, Tomohiko Abe, Soichiro Arai, Shigeru Maruyama, Hiroshi Yasuda +4 more 2000-09-12
5977548 Charged particle beam exposure system and method Yoshihisa Oae, Tomohiko Abe, Soichiro Arai, Shigeru Maruyama, Hiroshi Yasuda +4 more 1999-11-02
5969365 Charged-particle-beam exposure device and charged-particle-beam exposure method Akio Takemoto, Yoshihisa Ooaeh, Tomohiko Abe, Hiroshi Yasuda, Takamasa Satoh +7 more 1999-10-19
5920077 Charged particle beam exposure system Yoshihisa Oae, Tomohiko Abe, Soichiro Arai, Shigeru Maruyama, Hiroshi Yasuda +4 more 1999-07-06
5757015 Charged-particle-beam exposure device and charged-particle-beam exposure method Akio Takemoto, Yoshihisa Ooaeh, Tomohiko Abe, Hiroshi Yasuda, Takamasa Satoh +7 more 1998-05-26
5614725 Charged particle beam exposure system and method Yoshihisa Oae, Tomohiko Abe, Soichiro Arai, Shigeru Maruyama, Hiroshi Yasuda +4 more 1997-03-25
5528048 Charged particle beam exposure system and method Yoshihisa Oae, Tomohiko Abe, Soichiro Arai, Shigeru Maruyama, Hiroshi Yasuda +4 more 1996-06-18