Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11815470 | Multi-perspective wafer analysis | Haim Feldman, Eyal NEISTEIN, Shahar Arad, Ido Almog, Ori Golani | 2023-11-14 |
| 11195267 | Multi-perspective wafer analysis using an acousto-optic deflector | Doron Korngut, Ori Golani, Ido Almog | 2021-12-07 |
| 10902582 | Computerized system and method for obtaining information about a region of an object | Haim Feldman, Eyal NEISTEIN, Shahar Arad, Ido Almog | 2021-01-26 |
| 9846128 | Inspection system and a method for evaluating an exit pupil of an inspection system | Ido Kofler, Ido Dolev | 2017-12-19 |