Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7608843 | Method and apparatus for scanning a workpiece through an ion beam | Avrum Freytsis, Matthew C. Gwinn | 2009-10-27 |
| 6534775 | Electrostatic trap for particles entrained in an ion beam | Victor M. Benveniste, Michael Graf, Robert D. Rathmell | 2003-03-18 |
| 6525326 | System and method for removing particles entrained in an ion beam | Victor M. Benveniste, Jeffrey A. Burgess, John Zheng Ye | 2003-02-25 |
| 6476399 | System and method for removing contaminant particles relative to an ion beam | Victor M. Benveniste, Michael Graf, Robert D. Rathmell | 2002-11-05 |