Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11861824 | Reference image grouping in overlay metrology | Naama Cohen, Yuval Lamhot | 2024-01-02 |
| 11615974 | Fab management with dynamic sampling plans, optimized wafer measurement paths and optimized wafer transport, using quantum computing | Amnon Manassen, Tzahi Grunzweig, Anna Golotsvan | 2023-03-28 |
| 11158548 | Overlay measurement using multiple wavelengths | Yuval Lamhot, Eran Amit, Noga Sella, Wei-Te Cheng, Ido Adam | 2021-10-26 |
| 10699969 | Quick adjustment of metrology measurement parameters according to process variation | Eran Amit, Alexander Svizher, Yuval Lamhot, Noga Sella, Wei-Te Cheng | 2020-06-30 |
| 10504802 | Target location in semiconductor manufacturing | Naomi Ittah, Nadav Gutman, Eran Amit, Vincent Immer | 2019-12-10 |