Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8036447 | Inspection apparatus for inspecting patterns of a substrate | Koichi Hayakawa, Hiroshi Miyai, Masaaki Nojiri, Michio Nakano, Takako Fujisawa | 2011-10-11 |
| 7889911 | Image processing unit for wafer inspection tool | Michio Nakano, Shigeya Tanaka, Yoshiyuki Momiyama, Takashi Hiroi, Kazuya Hayashi +3 more | 2011-02-15 |
| 7421110 | Image processing unit for wafer inspection tool | Michio Nakano, Shigeya Tanaka, Yoshiyuki Momiyama, Takashi Hiroi, Kazuya Hayashi +3 more | 2008-09-02 |
| 6996130 | Distributed control system and filtering method used in the distributed control system | Masahiro Ohashi, Takeiki Aizono, Hiroyuki Tanaka, Makoto Kogure | 2006-02-07 |
| 6986029 | Micro-controller for reading out compressed instruction code and program memory for compressing instruction code and storing therein | Hiromichi Yamada, Yasuhiro Nakatsuka, Takashi Hotta, Kotaro Shimamura, Tatsuki Inuduka +1 more | 2006-01-10 |
| 6957109 | Distributed control system and filtering method used in the distributed control system | Masahiro Ohashi, Takeiki Aizono, Hiroyuki Tanaka, Makoto Kogure | 2005-10-18 |
| 6915413 | Micro-controller for reading out compressed instruction code and program memory for compressing instruction code and storing therein | Hiromichi Yamada, Yasuhiro Nakatsuka, Takashi Hotta, Kotaro Shimamura, Tatsuki Inuduka +1 more | 2005-07-05 |
| 6708069 | Distributed control system and filtering method used in the distributed control system | Masahiro Ohashi, Takeiki Aizono, Hiroyuki Tanaka, Makoto Kogure | 2004-03-16 |
| 6681139 | Distributed control system and filtering method used in the distributed control system | Masahiro Ohashi, Takeiki Aizono, Hiroyuki Tanaka, Makoto Kogure | 2004-01-20 |
| 6609232 | Logic compound method and logic compound apparatus | Teppei Hirotsu, Ryo Fujita, Kotaro Shimamura, Hiromichi Yamada, Haruyuki Nakayama | 2003-08-19 |