CW

Changting Wang

GE: 20 patents #1,365 of 36,430Top 4%
Huawei: 1 patents #8,196 of 15,535Top 55%
Overall (All Time): #208,552 of 4,157,543Top 6%
21
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
10324896 Method and apparatus for acquiring resource Jin Zhang 2019-06-18
9759686 Magnetic inspection systems for inspection of target objects Mandar Diwakar Godbole, Andrzej Michal May, Nilesh Tralshawala, Waseem Ibrahim Faidi 2017-09-12
8884614 Eddy current array probe Yuri Alexeyevich Plotnikov, Mandar Diwakar Godbole, Aparna Chakrapani Sheila-Vadde 2014-11-11
8710834 Drive coil, measurement probe comprising the drive coil and methods utilizing the measurement probe Andrzej Michal May, Waseem Ibrahim Faidi, Nilesh Tralshawala, Aparna Chakrapani Sheila-Vadde, Mandar Diwakar Godbole +3 more 2014-04-29
8436608 Eddy current inspection system and method Haiyan Sun, Yuri Alexeyevich Plotnikov, Shridhar Champaknath Nath, Aparna Chakrapani Sheila-Vadde 2013-05-07
8378668 Method for non-destructive testing of composite systems Waseem Ibrahim Faidi, Stephane Renou, Shu Ching Quek, Nilesh Tralshawala, Aparna Chakrapani Sheila-Vadde +1 more 2013-02-19
8269489 System and method for eddy current inspection of parts with complex geometries Yury Alexeyevich Plotnikov, Ui Suh, William Stewart McKnight 2012-09-18
8179132 Method and system for integrating eddy current inspection with a coordinate measuring device Yanyan Wu, Thomas James Batzinger, Nicholas Joseph Kray, Haiyan Sun, Francis Howard Little +2 more 2012-05-15
7994780 System and method for inspection of parts with an eddy current probe Haiyan Sun, William Stewart McKnight 2011-08-09
7952348 Flexible eddy current array probe and methods of assembling the same Haiyan Sun, Yuri Alexeyevich Plotnikov, William Stewart McKnight, Ui Suh 2011-05-31
7948233 Omnidirectional eddy current array probes and methods of use Aparna Chakrapani Sheila-Vadde, Ui Suh 2011-05-24
7888932 Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same William Stewart McKnight, Ui Suh, Yuri Alexeyevich Plotnikov, Ralph Gerald Isaacs 2011-02-15
7817845 Multi-frequency image processing for inspecting parts having complex geometric shapes Ui Suh, Gigi Gambrell, William Stewart McKnight, Preeti Pisupati, Peyush Kumar Mishra +1 more 2010-10-19
7518359 Inspection of non-planar parts using multifrequency eddy current with phase analysis Ui Suh 2009-04-14
7402999 Pulsed eddy current pipeline inspection system and method Yuri Alexeyevich Plotnikov, Andrew May, Shridhar Champaknath Nath 2008-07-22
7206706 Inspection method and system using multifrequency phase analysis William Stewart McKnight, Ui Suh, Serkan Ertekin 2007-04-17
7154265 Eddy current probe and inspection method Mottito Togo, Yuri Alexeyevich Plotnikov, Shyamsunder Tondanur Mandayam, William Stewart McKnight, Walter J. Bantz +1 more 2006-12-26
7015690 Omnidirectional eddy current probe and inspection system Yuri Alexeyevich Plotnikov, Shridhar Champaknath Nath, William Stewart McKnight, Gigi Gambrell 2006-03-21
7005851 Methods and apparatus for inspection utilizing pulsed eddy current Andrew May, Yuri Alexeyevich Plotnikov 2006-02-28
6999291 Method and apparatus for node electronics unit architecture Emad Andarawis Andarawis, Daniel White Sexton, Austars Raymond Schnore, Jr., Ertugrul Berkcan, Samantha Rao +5 more 2006-02-14
6892115 Method and apparatus for optimized centralized critical control architecture for switchgear and power equipment Ertugrul Berkcan, Daniel White Sexton, Scott Charles Evans, Marc Robert Pearlman, Emad Andarawis Andarawis +4 more 2005-05-10