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Optical fiber-based hydrophone |
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2025-09-02 |
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Narendra Devta-Prasanna, Sandeep Kumar Goel |
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Test technique to apply a variable scan clock including a scan clock modifier on an integrated circuit |
Sreejit Chakravarty, Narendra B. Devta-Prasa, Fan Yang |
2013-04-09 |
| 7831876 |
Testing a circuit with compressed scan chain subsets |
Saket K. Goyal, Thai M. Nguyen |
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Method for implementing test generation for systematic scan reconfiguration in an integrated circuit |
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Narendra Devta-Prasanna |
2008-12-02 |
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Narendra Devta-Prasanna |
2008-12-02 |
| 7293210 |
System and method for improving transition delay fault coverage in delay fault tests through use of transition launch flip-flop |
Narendra Devta-Prasanna |
2007-11-06 |
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Method of analyzing static current test vectors with reduced file sizes for semiconductor integrated circuits |
Hunaid Hussain, Pradipta Ghosh |
2002-09-10 |
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IDDQ test solution for large asics |
Venkat C. Ghanta, Kaushik De |
2001-04-03 |
| 5903578 |
Test shells for protecting proprietary information in asic cores |
Kaushik De, Siva Venkatraman |
1999-05-11 |
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Defect isolation using scan-path testing and electron beam probing in multi-level high density asics |
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1997-09-02 |
