Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8418008 | Test technique to apply a variable scan clock including a scan clock modifier on an integrated circuit | Sreejit Chakravarty, Arun Gunda, Fan Yang | 2013-04-09 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8418008 | Test technique to apply a variable scan clock including a scan clock modifier on an integrated circuit | Sreejit Chakravarty, Arun Gunda, Fan Yang | 2013-04-09 |