Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5663967 | Defect isolation using scan-path testing and electron beam probing in multi-level high density asics | Grant Lindberg, Kaushik De, Arun Gunda | 1997-09-02 |
SP
Sharad Prasad
Overall (All Time): #3,723,860 of 4,157,543Top 90%
1
Patents All Time