Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12165023 | Measuring local CD uniformity using scatterometry and machine learning | Dexin Kong, Daniel Schmidt, Marjorie Cheng, Roy Koret, Igor Turovets | 2024-12-10 |
| 11295969 | Hybridization for characterization and metrology | Gangadhara Raja Muthinti, Matthew Sendelbach, Roy Koret, Wei Ti Lee | 2022-04-05 |
| 10534275 | Method for use in process control of manufacture of patterned sample | Cornel Bozdog, Paul ISBESTER | 2020-01-14 |