CB

Christopher F. Bevis

KL Kla-Tencor: 49 patents #127 of 1,394Top 10%
NI Nova Measuring Instruments: 2 patents #43 of 108Top 40%
TI Tencor Instruments: 2 patents #17 of 50Top 35%
ST Scanit Technologies: 1 patents #4 of 9Top 45%
📍 Los Gatos, CA: #115 of 2,986 inventorsTop 4%
🗺 California: #6,949 of 386,348 inventorsTop 2%
Overall (All Time): #47,472 of 4,157,543Top 2%
54
Patents All Time

Issued Patents All Time

Showing 51–54 of 54 patents

Patent #TitleCo-InventorsDate
6686996 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool Paul Sullivan, George Kren, Rodney Smedt, Hans J. Hansen, David W. Shortt +1 more 2004-02-03
6414752 Method and apparatus for scanning, stitching, and damping measurements of a double-sided metrology inspection tool Paul Sullivan, George Kren, Rodney Smedt, Hans J. Hansen, David W. Shortt +1 more 2002-07-02
5416594 Surface scanner with thin film gauge Kenneth P. Gross, George Kren 1995-05-16
5241366 Thin film thickness monitor Armand P. Neukermans, Stanley Stokowski, Ralph C. Wolf, Matthew B. Lutzker 1993-08-31