Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5241366 | Thin film thickness monitor | Christopher F. Bevis, Armand P. Neukermans, Stanley Stokowski, Ralph C. Wolf | 1993-08-31 |
| 4805123 | Automatic photomask and reticle inspection method and apparatus including improved defect detector and alignment sub-systems | Donald F. Specht, Tim S. Wihl, Scott A. Young, James J. Hager, Jr. | 1989-02-14 |